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Springer Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)
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Description
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 3709172047
- Domain
- Amazon UK
- Publication Date
- 01 November 2012
- Listed Since
- 17 April 2014
Barcode
No barcode data available
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