We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£52.41
Springer Theory of Defects in Semiconductors: 104 (Topics in Applied Physics, 104)
Price data last checked 56 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
This is the most expensive it has ever been. Walk away.
£52 today · previous high £52 · all-time low £47
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 35 days • 35 data points (No recent data available)
Price Distribution
Price distribution over 35 days • 4 price levels
Price Analysis
Most common price: £50 (19 days, 54.3%)
Price range: £47 - £52
Price levels: 4 different prices over 35 days
Description
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 3540334009
- Domain
- Amazon UK
- Release Date
- 18 October 2006
- Listed Since
- 12 February 2007
Barcode
No barcode data available
Similar Products You Might Like
Theory of Defects in Semiconductors: 104 (Topics in Applied Physics, 104)
Springer
Extended Defects in Semiconductors: Electronic Properties, Device Effects And Structures
Cambridge University Press
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)
Springer
Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion (Engineering Materials and Processes)
Springer
Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion (Engineering Materials and Processes)
Springer
Photo-induced Defects Semiconductrs: 4 (Cambridge Studies in Semiconductor Physics and Microelectronic Engineering, Series Number 4)
Cambridge University Press
Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the seventh conference on Defect Recognition and Image Processing, ... 160 (Institute of Physics Conference Series)
CRC Press
Wiley - Defects in Organic Semiconductors and Devices Book
Wiley
Dopants and Defects in Semiconductors
CRC Press
D(X) Centres and other Metastable Defects in Semiconductors, Proceedings of the INT Symposium, Mauterndorf, Austria, 18-22 February 1991: Proceedings ... Mauterndorf, Austria, 18-22 February 1991
CRC Press
Theoretical Modelling of Semiconductor Surfaces (Microscopic Studies of Electrons & Phonons)
Scientific Publishing
Dopants and Defects in Semiconductors
CRC Press
Identification of Defects in Semiconductors (Volume 51B) (Semiconductors and Semimetals, Volume 51B)
Academic Press
The Physics of Semiconductors: An Introduction Including Nanophysics and Applications (Graduate Texts in Physics)
Springer
Gettering Defects in Semiconductors: 19 (Springer Series in Advanced Microelectronics, 19)
Springer
Electron & Molecular Phenomena on the Surface of Semiconductors (Physics Research and Technology)
Defects in Microelectronic Materials and Devices
CRC Press
New Developments in Semiconductor Research
Brand: Nova Science Pub Inc
Defects in Functional Materials
World Scientific Publishing Company
Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK: 164
CRC Press
Heteroepitaxy of Semiconductors: Theory, Growth, and Characterization, Second Edition
CRC Press
Modern Semiconductor Physics and Device Applications
CRC Press
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)
Springer
Physics of Semiconductors 2002: Proceedings of the 26th International Conference, Edinburgh, 29 July to 2 August 2002: 1 (Institute of Physics Conference Series)
CRC Press