Defects in SiO2 and Related Dielectrics: Science and Technology: 2 (NATO Science Series II: Mathematics, Physics and Chemistry, 2) - Image 1

£165.06

Springer Defects in SiO2 and Related Dielectrics: Science and Technology: 2 (NATO Science Series II: Mathematics, Physics and Chemistry, 2)

Name: Defects in SiO2 and Related Dielectrics: Science and Technology: 2 (NATO Science Series II: Mathematics, Physics and Chemistry, 2)
Brand: Springer
Price: 164.98 GBP
Availability: InStock

Chemistry

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Description

Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

Product Specifications

Brand: Springer
Format: paperback
ASIN: 0792366867
Category: Books > Subjects > Science, Nature & Maths > Chemistry
Domain: Amazon UK
Release Date: 31 December 2000
Listed Since: 09 December 2006

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Springer Defects in SiO2 and Related Dielectrics: Science and Technology: 2 (NATO Science Series II: Mathematics, Physics and Chemistry, 2)

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