£142.00

Nova Science Publishers Inc Nova Science AFM Principles, Modes & Limitations Book

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Description

In the rapidly evolving field of nanotechnology, having the right tools to investigate and manipulate molecules at the nanoscale is essential for scientific research and industrial development. This comprehensive resource from Nova Science Publishers Inc covers the fundamental principles of Atomic Force Microscopy (AFM). Since its invention in 1986, AFM has become a standard nanotechnology tool due to its high resolution and minimal sample preparation requirements. This book explores how the equipment utilizes the force between a scanning tip and a sample to provide insights that are close to the original status of the specimen. Whether you are working with macromolecules or conducting chemistry research, understanding the various modes of operation and the inherent limitations of this technology is vital. This text serves as a specialized reference for researchers needing to master nanoscale investigation techniques in modern laboratory settings.

Key Features

Covers the core principles of Atomic Force Microscopy to help researchers understand nanoscale investigation.

Explores different modes of operation for applying AFM in various chemistry research and application settings.

Discusses the limitations of AFM technology to assist in better experimental design and data interpretation.

Provides insight into how AFM maintains samples in a state close to their original status during imaging.

Detailed information on the use of scanning tips and force interaction for high-resolution molecular analysis.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
01 June 2014
Listed Since
02 January 2014

Barcode

No barcode data available

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