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Springer Noncontact Atomic Force Microscopy Volume 2 Book

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Description

Expand your scientific knowledge with Noncontact Atomic Force Microscopy: Volume 2 from Springer. This second volume of the NanoScience and Technology series covers significant advancements in noncontact atomic force microscopy (NC-AFM) achieved since the original 2002 publication. This text explores recent results obtained with atomic resolution, including force spectroscopy and mapping. It provides detailed information on tuning fork technology, atomic manipulation, and magnetic exchange force microscopy. Readers will also find insights into atomic and molecular imaging in liquids and other new technologies. This resource is designed to support the evolution of NC-AFM into practical tools for the characterization and manipulation of matter at the atomic level.

Key Features

This Springer publication covers recent advancements in noncontact atomic force microscopy achieved since 2002.

The text provides detailed information on force spectroscopy and mapping with atomic resolution.

Readers can study new developments in tuning fork technology and atomic manipulation techniques.

The book explores magnetic exchange force microscopy and atomic and molecular imaging in liquids.

This volume serves as a resource for understanding new technologies in NC-AFM characterization.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
14 March 2012
Listed Since
15 December 2011

Barcode

No barcode data available

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