Springer Noncontact Atomic Force Microscopy: Volume 2 Book

Expand your scientific knowledge with Noncontact Atomic Force Microscopy: Volume 2 from the NanoScience and Technology series. This second edition provides an updated look at the significant progress made in noncontact atomic force microscopy (NC-AFM) since the original 2002 publication. This volume covers recent results achieved with atomic resolution, providing essential information for researchers and students in physical chemistry and nanotechnology. It details advancements in force spectroscopy and mapping, the use of tuning forks, and atomic manipulation techniques. Readers will find detailed information on magnetic exchange force microscopy, as well as atomic and molecular imaging in liquids. By exploring these new technologies, this book helps bridge the gap between theoretical research and the use of NC-AFM as a practical tool for the characterization and manipulation of matter. It is an essential resource for anyone studying the latest developments in high-resolution imaging and microscopic technologies.