£64.14

CBS Atomic Force Microscopy

Chemistry

This is the usual price. Wait for it to drop, or tell us your number.

£64 today · usual range £0–£0 · best ever £45

NEW HERE?

Amazon shows you one price. We show you all of them.

Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.

WHAT'S ON THIS PAGE

↓ Price chart
when this has been cheap or pricey

↓ Forecast
where the price is heading next

↓ Statistics
all-time high & low, recent range

↑ Price alert
name your number, we'll email you

Price History & Forecast

Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.

Last 639 days • 639 data points (No recent data available)

Historical

Generating forecast...

Price Distribution

Price distribution over 639 days • 5 price ranges

Days at Price

Current Price

Price Analysis

Most common range: £45-65 (515 days, 80.6%)

Price range: £45 - £145

Price levels: 5 price ranges over 639 days

Description

The atomic force microscope (AFM) is one kind of scanning probe microscopes (SPM). SPMs are designed to measure local properties, such as height, friction, magnetism, with a probe. To acquire an image, the SPM raster-scans the probe over a small area of the sample, measuring the local property simultaneously. The information is gathered by ""feeling"" or ""touching"" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable very precise scanning. Compared to competitive technologies such as optical microscopy and electron microscopy, the major diﬀerence between these and the atomic-force microscope is that the latter does not use lenses or beam irradiation. Therefore, it does not suﬀer from a limitation of space resolution due to diﬀraction limit and aberration, and it is not necessary to prepare a space for guiding the beam (by creating a vacuum) or to stain the sample. Piezo-ceramics position the tip with high resolution. Piezoelectric ceramics are a class of materials that expand or contract when in the presence of a voltage gradient. Piezo-ceramics make it possible to create three-dimensional positioning devices of arbitrarily high precision. In contact mode, AFMs use feedback to regulate the force on the sample. The AFM not only measures the force on the sample but also regulates it, allowing acquisition of images at very low forces. The feedback loop consists of the tube scanner that controls the height of the tip; the cantilever and optical lever, which measures the local height of the sample; and a feedback circuit that attempts to keep the cantilever deﬂection constant by adjusting the voltage applied to the scanner. The atomic force microscope is a powerful tool that is invaluable if to measure incredibly small samples with a great degree of accuracy. Unlike rival technologies it does not require either a vacuum or the sample to undergo treatment that might damage it. At the limits of operation however, researchers have demonstrated atomic resolution in high vacuum and even liquid environments. The book entitled Atomic Force Microscopy covers the applications and theories of atomic force microscope.

Product Specifications

Brand: CBS
Format: hardcover
ASIN: 1681172127
Category: Books > Subjects > Science, Nature & Maths > Chemistry
Domain: Amazon UK
Release Date: 01 April 2016
Listed Since: 07 April 2016

Barcode

No barcode data available

CBS Atomic Force Microscopy

This is the usual price. Wait for it to drop, or tell us your number.

Price History & Forecast

Price Distribution

Price Analysis

Description

Product Specifications

Barcode

Similar Products You Might Like

Atomic Force Microscopy: Fundamental Concepts and Laboratory Investigations

Noncontact Atomic Force Microscopy (NanoScience and Technology)

Atomic Force Microscopy For Biologists (2nd Edition)

Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

Noncontact Atomic Force Microscopy: Volume 3 (NanoScience and Technology)

Noncontact Atomic Force Microscopy: Volume 3 (NanoScience and Technology)

Electrical Atomic Force Microscopy for Nanoelectronics (NanoScience and Technology)

Atomic Force Microscopy: Fundamental Concepts and Laboratory Investigations

Atomic Force Microscopy in Cell Biology Volume 68

Atomic Force Microscopy in Cell Biology: 68 (Methods in Cell Biology): Volume 68

Noncontact Atomic Force Microscopy: Volume 2 (NanoScience and Technology)

Springer Noncontact Atomic Force Microscopy: Volume 2 Book

Atomic Force Microscopy (NanoScience and Technology)

Nova Science AFM Principles, Modes & Limitations Book

Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation

Scanning Force Microscopy of Polymers (Springer Laboratory)

Atomic Force Microscopy in Adhesion Studies

Applied Scanning Probe Methods XII: Characterization (NanoScience and Technology)

Forces in Scanning Probe Methods: 286 (NATO Science Series E:, 286)

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)

Life at the Nanoscale: Atomic Force Microscopy of Live Cells

Applied Scanning Probe Methods X: Biomimetics and Industrial Applications (NanoScience and Technology)

Applied Scanning Probe Methods IX: Characterization (NanoScience and Technology)