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£159 today · usual range £151–£166 · best ever £151

Springer Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)

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£165.80 £149.52 £153.07 £156.62 £160.18 £163.73 £167.28 25 July 2026 11 August 2026 29 August 2026 15 September 2026 03 October 2026
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35 days 20 days · current 16 days 0 9 18 26 35 £151 £159 £166 Days at Price

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Most common price: £151 (35 days, 49.3%)

Price range: £151 - £166

Price levels: 3 different prices over 71 days

Description

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
04 August 2006
Listed Since
19 January 2007

Barcode

No barcode data available

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