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Springer Atomic Force Microscopy/Scanning Tunneling Microscopy 2 - Springer

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Description

This comprehensive volume collects papers presented at the second AFM/STM Symposium held in June 1994 at Natick Research, Development and Engineering Center in Massachusetts. The symposium brought together scientists specialising in atomic force microscopy, scanning tunneling microscopy, and other probe microscopy techniques to exchange ideas, discuss recent advances, and explore collaborative opportunities. The proceedings document the state of AFM and STM research and applications from leading experts in the field, making it an essential reference for analytical chemists, materials scientists, and microscopy researchers seeking to understand developments in probe microscopy during the mid-1990s. This book serves as both a historical record of the symposium discussions and a technical resource for those working with scanning probe techniques.

Key Features

AFM/STM Symposium proceedings from the 1994 Natick conference featuring papers on atomic force microscopy and scanning tunneling microscopy.

Contributions from leading scientists in probe microscopy techniques, covering research applications and collaborative developments.

Springer publication providing authoritative analytical chemistry content for academic and industrial microscopists.

Essential reference for understanding scanning tunneling microscopy and atomic force microscopy advances during the mid-1990s.

Product Specifications

Format
paperback
Domain
Amazon UK
Publication Date
04 June 2013
Listed Since
07 November 2013

Barcode

No barcode data available

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