£113.09

Springer Atomic Force Microscopy/Scanning Tunneling Microscopy 2

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Description

Explore the latest advancements in probe microscopy through this comprehensive collection of scientific research. This book compiles the papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, which took place from June 7 to 9, 1994, in Natick, Massachusetts. Held at the Natick Research, Development and Engineering Center, this volume serves as a vital record of scientific exchange. This publication provides a dedicated forum for researchers focused on AFM, STM, and related probe microscopies. By reading this collection, scientists can access the ideas and findings shared during the symposium, allowing them to stay informed about the technical developments of the era. It is an essential resource for those looking to understand the collaborative efforts and research directions that shaped the field of analytical chemistry and microscopic imaging. Whether you are a researcher or a student, this Springer publication offers a deep look into the professional discussions and future possibilities identified by experts in the field.

Key Features

Comprehensive collection of papers from the second AFM/STM Symposium held in 1994.

Provides a detailed record of scientific discussions regarding AFM and STM technologies.

Serves as a professional forum for researchers interested in probe microscopies.

Includes research presented at the Natick Research, Development and Engineering Center.

Facilitates understanding of historical scientific collaborations and research ideas.

Published by Springer, a trusted name in scientific and academic literature.

Product Specifications

Format
paperback
Domain
Amazon UK
Publication Date
04 June 2013
Listed Since
07 November 2013

Barcode

No barcode data available

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