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£113.09
Springer Atomic Force Microscopy/Scanning Tunneling Microscopy 2
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Description
Key Features
Comprehensive collection of papers from the second AFM/STM Symposium held in 1994.
Provides a detailed record of scientific discussions regarding AFM and STM technologies.
Serves as a professional forum for researchers interested in probe microscopies.
Includes research presented at the Natick Research, Development and Engineering Center.
Facilitates understanding of historical scientific collaborations and research ideas.
Published by Springer, a trusted name in scientific and academic literature.
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 1475793278
- Domain
- Amazon UK
- Publication Date
- 04 June 2013
- Listed Since
- 07 November 2013
Barcode
No barcode data available
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