£88.02

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£88 today · all-time low £87 (Jul 2026) · usually £88

Springer Atomic Force Microscopy/Scanning Tunneling Microscopy 2 - Springer

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£112.59 £84.57 £90.69 £96.80 £102.91 £109.02 £115.14 28 July 2026 18 August 2026 09 September 2026 01 October 2026 23 October 2026
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5 days 30 days · current 16 days 24 days 13 days 0 8 15 23 30 £87 £88 £109 £111 £113 Days at Price

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Price range: £87 - £113

Price levels: 5 different prices over 88 days

Description

This comprehensive collection compiles papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy symposium held June 7 to 9, 1994, in Natick, Massachusetts. The volume brings together contributions from leading scientists specialising in AFM, STM, and other probe microscopies, providing a detailed record of cutting-edge research and technical discussions from the event. Like its predecessor from 1993, this symposium created an essential forum for researchers to exchange ideas, share findings, and explore collaborative opportunities within the field of advanced microscopy techniques. The book serves as a valuable reference for analytical chemists, materials scientists, and researchers working with atomic-scale imaging and surface analysis methods.

Key Features

Atomic Force Microscopy/Scanning Tunneling Microscopy 2 contains peer-reviewed papers from the second major AFM/STM symposium held in 1994.

The Springer publication compiles research from scientists specialising in probe microscopy techniques and surface characterisation methods.

Papers cover discussions on AFM, STM, and related probe microscopies, reflecting the state of technology in 1994.

This volume documents collaborative research directions and emerging applications in analytical chemistry and materials science.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
30 April 1997
Listed Since
14 December 2006

Barcode

No barcode data available

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