£109.47

Springer Atomic Force Microscopy/Scanning Tunneling Microscopy 2

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Description

This specialized scientific volume from Springer provides a comprehensive compilation of research presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium. Held in June 1994 at the Natick Research, Development and Engineering Center, this collection serves as a vital resource for researchers and academics in the field of probe microscopy. The text captures the collaborative spirit of the 1994 symposium, offering a dedicated forum where scientists focused on AFM, STM, and related technologies could exchange ideas. By documenting these discussions, the book provides insight into the professional interactions and the exploration of future collaborations that occurred during the event. It is an essential reference for those studying analytical chemistry and advanced microscopy techniques, preserving the technical dialogue and scientific progress shared by experts in the field.

Key Features

Contains a complete compilation of papers from the second AFM/STM Symposium held in June 1994.

Provides a technical record of scientific discussions regarding Atomic Force Microscopy and Scanning Tunneling Microscopy.

Serves as a professional resource for scientists interested in probe microscopy and analytical chemistry.

Documents the exchange of ideas and collaborative efforts from the Natick Research, Development and Engineering Center event.

Offers valuable insights into the historical development and professional relationships within the microscopy community.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
30 April 1997
Listed Since
14 December 2006

Barcode

No barcode data available

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