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CRC Press Scanning Probe Microscopes - Science and Technology

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Description

Scanning Probe Microscopes: Applications in Science and Technology by CRC Press provides a comprehensive look at the most widely used tools in the scanning probe microscope family. This technical reference offers a deep dive into the development and practical use of scanning tunneling microscopes (STMs) and atomic force microscopes (AFMs), as well as other specialized SPM types. Readers will find a structured approach that begins with the fundamental basics of SPM technology before moving into technical details regarding different apparatus and calibration methods. The book is designed to serve as both a theoretical guide and a practical manual, providing extensive references and experimental procedures to support scientific research. Each chapter is organized to explore different kinds of molecular species, making it a versatile resource for scientists and engineers working in nanotechnology and material science. Whether you are studying the basics of scanning tunneling or looking for specific experimental workflows, this text delivers the detailed information needed for advanced microscopy applications.

Key Features

Comprehensive overview of scanning probe microscope development and the foundational basics of STMs and AFMs.

Detailed technical descriptions of different microscope apparatus and specialized SPM types for scientific research.

Clear guidance on calibration methods to ensure accuracy in microscopy measurements and data collection.

Practical utility through included experimental procedures and extensive references for advanced study.

Organized topical structure that explores various molecular species in dedicated subsequent chapters.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
26 February 2003
Listed Since
10 February 2007

Barcode

No barcode data available

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