We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£116.44
Springer Applied Scanning Probe Methods I - NanoScience Book
Price data last checked 51 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
This is the most expensive it has ever been. Walk away.
£116 today · previous high £116 · all-time low £115
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 40 days • 40 data points (No recent data available)
Price Distribution
Price distribution over 40 days • 2 price levels
Price Analysis
Most common price: £116 (29 days, 72.5%)
Price range: £115 - £116
Price levels: 2 different prices over 40 days
Description
Key Features
Covers the theoretical background of static and dynamic force microscopies to build a strong technical foundation.
Provides detailed information on sensor technology and tip characterization for accurate scanning probe work.
Examines applications across diverse materials including semiconductors, polymers, ceramics, and biological materials.
Includes research on topographic and dynamical surface studies for industrial-scale applications.
Details specific practical uses such as macro- and nanotribology and polymer surface analysis.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 3540005277
- Domain
- Amazon UK
- Release Date
- 13 January 2004
- Listed Since
- 12 December 2006
Barcode
No barcode data available
Similar Products You Might Like
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
Springer
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
Springer
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
Springer
Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale
Springer
Springer Scanning Probe Microscopy - AFM and STM Textbook
Springer
Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale
Springer
Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (NanoScience and Technology)
Springer
Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
Springer
SCANNING PROBE MICROSCOPY FOR ENERGY RESEARCH: MATERIALS, DEVICES, AND APPLICATIONS: 7 (World Scientific Series in Nanoscience and Nanotechnology)
World Scientific Publishing Company
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
Springer
Scanning Probe Microscopy
World Scientific Publishing Company
SCANNING PROBE MICROSCOPY
World Scientific Publishing Company
Scanning Probe Microscopy: The Lab on a Tip (Graduate Texts in Physics)
Springer
Roadmap of Scanning Probe Microscopy (NanoScience and Technology)
Springer
Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques (NanoScience and Technology)
Springer
Springer Atomic Force Microscopy/Scanning Tunneling Microscopy 3
Springer
CRC Press Scanning Probe Microscopes - Science and Technology
CRC Press
Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques (NanoScience and Technology)
Springer
Springer Applied Scanning Probe Methods VI: Characterization
Springer
Atomic Force Microscopy (NanoScience and Technology)
Springer
Scanning Probe Microscopy: The Lab on a Tip (Graduate Texts in Physics)
Springer
Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization
Wiley
Hybridizing Surface Probe Microscopies: Toward a Full Description of the Meso- and Nanoworlds
CRC Press
Scanning Microscopy for Nanotechnology: Techniques and Applications
Springer