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Springer Applied Scanning Probe Methods VI - Characterization

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Description

Stay updated with the latest advancements in nanotechnology through Applied Scanning Probe Methods VI: Characterization. Published by Springer as part of the NanoScience and Technology series, this volume addresses the rapid progression of the field. While previous volumes were released in 2004 and 2006, the speed of scientific discovery now requires regular updates to capture emerging developments. This sixth volume provides comprehensive coverage of the subject through 10 detailed chapters. It focuses on a variety of new and emerging techniques alongside refinements of existing SPM applications. This text serves as a vital resource for professionals and researchers needing to keep pace with the evolving landscape of scanning probe microscopy and characterization methods.

Key Features

This Springer publication is part of the NanoScience and Technology series focused on characterization.

The book contains 10 chapters covering a variety of new and emerging techniques in the field.

Volume VI provides updates on refinements of existing SPM applications for technical research.

This volume addresses the fast-moving developments in scanning probe methods to ensure technical accuracy.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
25 November 2010
Listed Since
20 September 2010

Barcode

No barcode data available

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