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Springer Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale
0OO9096
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Description
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
Product Specifications
- Brand
- Springer
- Model
- 0OO9096
- Format
- hardcover
- ASIN
- 0387286675
- Domain
- Amazon UK
- Release Date
- 18 December 2006
- Listed Since
- 14 February 2007
Barcode
No barcode data available
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