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£37.13
Springer Scanning Microscopy for Nanotechnology Book
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Price distribution over 43 days • 4 price levels
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Description
Key Features
Covers nanomaterials imaging and X-ray microanalysis to help researchers understand material structures and compositions.
Explores high-resolution SEM and low kV SEM techniques for detailed characterization at different scales.
Includes specialized methods like cryo-SEM to support advanced nanotechnology research requirements.
Provides information on new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy.
Discusses the integration of SEM with new technologies for in-situ nanomaterials engineering and manipulation.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 0387333258
- Domain
- Amazon UK
- Release Date
- 27 November 2006
- Listed Since
- 16 February 2007
Barcode
No barcode data available
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