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£137.45
CRC Press Microscopy of Semiconducting Materials 1987 Book
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Description
Key Features
Includes proceedings from the Institute of Physics Conference held at Oxford University in April 1987.
Covers essential electron probe methods, light optical techniques, and ion scattering methods for semiconductor research.
Provides technical details on high resolution microscopy and the study of epitaxial layers.
Contains research on quantum wells, superlattices, and bulk gallium arsenide compounds.
Offers a comprehensive look at the state of the art in microanalytical techniques for microelectronics.
Published by CRC Press for use in scientific research and analytical chemistry studies.
Product Specifications
- Brand
- CRC Press
- Format
- hardcover
- ASIN
- 0854981780
- Domain
- Amazon UK
- Release Date
- 01 October 1987
- Listed Since
- 23 January 2007
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No barcode data available
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