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£147.51
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£148 today · previous high £148 · all-time low £137
CRC Press Microscopy of Semiconducting Materials 1987 - Conference Proceedings
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Most common price: £148 (61 days, 84.7%)
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Description
Key Features
Covers high-resolution microscopy techniques and electron probe methods applied to semiconductor materials and research applications.
Includes detailed examination of epitaxial layers, quantum wells, and superlattices in semiconductor structures.
Presents proceedings from the Institute of Physics Conference held at Oxford University in April 1987.
Explores light optical and ion scattering techniques alongside electron microscopy for semiconductor analysis.
Addresses bulk gallium arsenide and other compound semiconductors used in microelectronics technology.
Published by CRC Press as a comprehensive reference for semiconductor microscopy state of the art research.
Product Specifications
- Brand
- CRC Press
- Format
- hardcover
- ASIN
- 0854981780
- Domain
- Amazon UK
- Release Date
- 01 October 1987
- Listed Since
- 23 January 2007
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No barcode data available
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