£86.31

World Scientific Publishing Company Secondary Electron Energy Spectroscopy in the Scanning Electron Microscope

Price data last checked 92 day(s) ago - refreshing...

View at Amazon

We'll watch every seller, every day. One email when your price arrives.

It has never been this cheap. We have no record of a lower price.

£86 today · cheaper than every other day in the last 3 months

NEW HERE?

Amazon shows you one price. We show you all of them.

Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.

WHAT'S ON THIS PAGE

↓ Price chart
when this has been cheap or pricey
↓ Forecast
where the price is heading next
↓ Statistics
all-time high & low, recent range
↑ Price alert
name your number, we'll email you

Price History & Forecast

Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.

Last 8 days • 8 data points (No recent data available)

Historical
Generating forecast...
£86.31 £81.99 £83.72 £85.45 £87.17 £88.90 £90.63 02 March 2026 03 March 2026 05 March 2026 07 March 2026 09 March 2026

Price Distribution

Price distribution over 8 days • 1 price levels

Days at Price
8 days 0 2 4 6 8 £86 Days at Price

Price Analysis

Most common price: £86 (8 days, 100.0%)

Price range: £86 - £86

Price levels: 1 different prices over 8 days

Description

This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpose of nanoscale topographic imaging. This book demonstrates the advantages of carrying out precision electron energy spectroscopy of its secondary electrons, in addition to them being used for imaging. The book will demonstrate how secondary electron energy spectroscopy can transform the SEM into a powerful analytical tool that can map valuable material science information to the nanoscale, superimposing it onto the instrument's normal topographic mode imaging. The book demonstrates how the SEM can then be used to quantify/identify materials, acquire bulk density of states information, capture dopant density distributions in semiconductor specimens, and map surface charge distributions.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
13 November 2020
Listed Since
04 September 2020

Barcode

No barcode data available

Similar Products You Might Like

Encyclopedia of Scanning Electron Microscopy
97% match

Encyclopedia of Scanning Electron Microscopy

NY Research Press

£66.50 09 Mar 2026
Scanning Microscopy for Nanotechnology: Techniques and Applications
97% match

Scanning Microscopy for Nanotechnology: Techniques and Applications

Springer

£170.85 16 Apr 2026
Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK: 164
96% match

Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK: 164

CRC Press

£471.29 19 Apr 2026
Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK: 107 (Springer Proceedings in Physics, 107)
96% match

Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK: 107 (Springer Proceedings in Physics, 107)

Springer

£91.96 12 Jan 2026
A Beginners' Guide to Scanning Electron Microscopy
96% match

A Beginners' Guide to Scanning Electron Microscopy

Springer

£79.93 21 Feb 2026
Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
96% match

Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy

Springer

£179.99 10 Mar 2026
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
96% match

Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

Springer

£104.20 11 Jan 2026
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis: 45 (Springer Series in Optical Sciences, 45)
96% match

Scanning Electron Microscopy: Physics of Image Formation and Microanalysis: 45 (Springer Series in Optical Sciences, 45)

Springer

£231.02 13 Jan 2026
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis: 45 (Springer Series in Optical Sciences, 45)
96% match

Scanning Electron Microscopy: Physics of Image Formation and Microanalysis: 45 (Springer Series in Optical Sciences, 45)

Springer

£241.00 13 Jan 2026
Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale
96% match

Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale

Springer

£61.30 07 Jan 2026
IN-SITU ELECTRON MICROSCOPY AT HIGH RESOLUTION
96% match

IN-SITU ELECTRON MICROSCOPY AT HIGH RESOLUTION

World Scientific Publishing Company

£49.93 11 Mar 2026
Introduction to the Electronic Properties of Materials
96% match

Introduction to the Electronic Properties of Materials

CRC Press

£175.79 08 Apr 2026
Scanning Electron Microscopy and X-Ray Microanalysis
96% match

Scanning Electron Microscopy and X-Ray Microanalysis

Springer

£81.03 14 Jan 2026
Experimental High-resolution Electron Microscopy (Monographs on the Physics & Chemistry of Materials)
96% match

Experimental High-resolution Electron Microscopy (Monographs on the Physics & Chemistry of Materials)

Oxford University Press

£75.00 10 Mar 2026
Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of ... 1997: 153 (Institute of Physics Conference)
95% match

Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of ... 1997: 153 (Institute of Physics Conference)

CRC Press

£141.70 23 Jan 2026
Microscopy of Semiconducting Materials 2003
95% match

Microscopy of Semiconducting Materials 2003

CRC Press

£192.44 12 Jan 2026
Wiley Electronic Materials Science - Advanced Science Textbook
95% match

Wiley Electronic Materials Science - Advanced Science Textbook

Wiley

£109.76 17 Apr 2026
Electrophysical Properties of Semiconductors: In Tables and Figures
95% match

Electrophysical Properties of Semiconductors: In Tables and Figures

£220.00 24 Jan 2026
Electron & Molecular Phenomena on the Surface of Semiconductors (Physics Research and Technology)
95% match

Electron & Molecular Phenomena on the Surface of Semiconductors (Physics Research and Technology)

£79.66 04 Mar 2026
Introduction to the Electronic Properties of Materials
95% match

Introduction to the Electronic Properties of Materials

CRC Press

£24.31 21 Feb 2026
Fundamentals of Electron Emission Physics
95% match

Fundamentals of Electron Emission Physics

Wiley

£84.26 01 Mar 2026
Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope
95% match

Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope

£160.00 21 Jan 2026
Electron Microscopes, Spectroscopy and Their Applications
95% match

Electron Microscopes, Spectroscopy and Their Applications

£114.00 07 Mar 2026
SCANNING PROBE MICROSCOPY FOR ENERGY RESEARCH: MATERIALS, DEVICES, AND APPLICATIONS: 7 (World Scientific Series in Nanoscience and Nanotechnology)
95% match

SCANNING PROBE MICROSCOPY FOR ENERGY RESEARCH: MATERIALS, DEVICES, AND APPLICATIONS: 7 (World Scientific Series in Nanoscience and Nanotechnology)

World Scientific Publishing Company

£74.01 04 Mar 2026