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Springer Scanning Electron Microscopy: Physics of Image Formation and Microanalysis: 45 (Springer Series in Optical Sciences, 45)
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Description
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Product Specifications
- Brand
- Springer
- Format
- Paperback
- ASIN
- 3642083722
- Domain
- Amazon UK
- Publication Date
- 01 December 2010
- Listed Since
- 14 June 2010
Barcode
No barcode data available
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