We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£231.02
Springer Scanning Electron Microscopy: Physics of Image Formation and Microanalysis: 45 (Springer Series in Optical Sciences, 45)
Price data last checked 147 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
This is the usual price. Wait for it to drop, or tell us your number.
£231 today · usual range £0–£0 · best ever £115
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 584 days • 584 data points (No recent data available)
Price Distribution
Price distribution over 584 days • 4 price ranges
Price Analysis
Most common range: £185-208 (305 days, 52.2%)
Price range: £115 - £231
Price levels: 4 price ranges over 584 days
Description
Product Specifications
- Brand
- Springer
- Format
- Paperback
- ASIN
- 3642083722
- Domain
- Amazon UK
- Publication Date
- 01 December 2010
- Listed Since
- 14 June 2010
Barcode
No barcode data available
Similar Products You Might Like
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis: 45 (Springer Series in Optical Sciences, 45)
Springer
Encyclopedia of Scanning Electron Microscopy
NY Research Press
Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope
Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale
Springer
Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale
Springer
Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
Springer
Secondary Electron Energy Spectroscopy in the Scanning Electron Microscope
World Scientific Publishing Company
Scanning Electron Microscopy for the Life Sciences (Advances in Microscopy and Microanalysis)
Cambridge University Press
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
Springer
Electron Microscopy and Analysis 2001: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of ... 168 (Institute of Physics Conference Series)
CRC Press
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
Springer
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
Springer
Springer Physical Principles of Electron Microscopy Textbook
Springer
Principles Electron Microscopy 2ed
Cambridge University Press
Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
Imperial College Press
Scanning Microscopy for Nanotechnology: Techniques and Applications
Springer
A Beginners' Guide to Scanning Electron Microscopy
Springer
Scanning Electron Microscope Optics and Spectrometer
World Scientific Publishing Company
Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003: 179 (Institute of Physics Conference)
CRC Press
Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of ... 1997: 153 (Institute of Physics Conference)
CRC Press
Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (NanoScience and Technology)
Springer
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
Springer
Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK: 107 (Springer Proceedings in Physics, 107)
Springer
Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (NanoScience and Technology)
Springer