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Springer Scanning Electron Microscopy: Physics of Image Formation and Microanalysis: 45 (Springer Series in Optical Sciences, 45)

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Description

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Product Specifications

Format
paperback
Domain
Amazon UK
Publication Date
01 December 2010
Listed Since
14 June 2010

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