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Springer Advanced Computing in Electron Microscopy - Springer

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Description

This updated and revised edition of a classic work provides a comprehensive summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to instrument and specimen interaction can complicate image interpretation. Image calculations help users interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including detailed discussion of higher order multipole aberrations and their effects on imaging. Essential for researchers, scientists, and engineers working with electron microscopy who need to master computational techniques for extracting maximum information from electron microscope data and improving image quality through advanced numerical methods.

Key Features

Advanced Computing in Electron Microscopy covers both conventional and scanning transmission electron microscope image computation methods for high resolution applications.

The book includes expanded sections on aberration correction with detailed discussion of higher order multipole aberrations and their imaging effects.

Numerical computation methods help interpret and understand high resolution information in recorded electron micrographs by reducing image artifacts.

Updated and revised content addresses current challenges in electron microscopy image interpretation at the limits of resolution.

Springer publication provides authoritative guidance on computational techniques for electron microscopy research and industrial applications.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
10 March 2020
Listed Since
12 September 2019

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No barcode data available

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