£120.83

Springer - Advanced Computing in Electron Microscopy Book

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Description

Improve your understanding of high resolution electron microscopy with this updated and revised edition from Springer. This classic work provides a comprehensive summary of methods for the numerical computation of conventional and scanning transmission electron microscope images. As researchers push toward the limits of resolution, image artifacts caused by the instrument or specimen interaction can make interpretation difficult. This book helps users navigate these challenges by using image calculations to better interpret and understand the high resolution information found in recorded electron micrographs. This edition includes expanded sections on aberration correction. It features a detailed discussion of higher order (multipole) aberrations and their effects, making it an essential resource for those working in advanced computing and electron microscopy research.

Key Features

Provides updated methods for numerical computation of high resolution conventional and scanning transmission electron microscope images.

Helps researchers interpret complex information in recorded electron micrographs through detailed image calculations.

Includes expanded sections on aberration correction to assist in managing instrument and specimen interaction artifacts.

Offers a detailed discussion regarding higher order (multipole) aberrations and their specific effects on imaging.

Serves as a revised and updated version of a classic text for professionals in the field of electron microscopy.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
10 March 2020
Listed Since
12 September 2019

Barcode

No barcode data available

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