£141.13

Springer Scanning Probe Microscopy - AFM and STM Textbook

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£141.13 £78.14 £91.89 £105.63 £119.37 £133.11 £146.86 13 June 2026 26 June 2026 09 July 2026 22 July 2026 05 August 2026

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Description

Master the fundamentals of nanotechnology with this comprehensive textbook from Springer. Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy provides a clear guide to the operating principles of both AFM and STM. This book is designed to help you operate scanning probe microscopes successfully and interpret the data you collect with confidence. Beyond specific scanning probe techniques, the text includes essential chapters on fundamentals and important technical aspects. This makes it a practical resource for anyone needing to bridge the gap between theory and hands-on application. Whether you are working in a lab or studying advanced microscopy, this book offers the technical knowledge required to navigate the field of nanoscience. This textbook is an ideal resource for graduate students in physics, materials science, chemistry, nanoscience, and engineering. It also serves as a valuable reference for researchers who are new to the field and looking to build a strong foundation in scanning probe microscopy techniques.

Key Features

Covers the core operating principles of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) for practical application.

Provides guidance on how to successfully operate a scanning probe microscope and understand the resulting data.

Includes dedicated chapters on fundamental concepts and important technical aspects to support your learning.

Designed for graduate students in physics, materials science, chemistry, nanoscience, and engineering.

Serves as a helpful introductory resource for researchers who are new to the field of scanning probe microscopy.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
23 March 2015
Listed Since
18 September 2014

Barcode

No barcode data available

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