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£91.38
Springer Scanning Probe Microscopy - AFM and STM Textbook
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Description
Key Features
Covers the core operating principles of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) for practical application.
Provides guidance on how to successfully operate a scanning probe microscope and understand the resulting data.
Includes dedicated chapters on fundamental concepts and important technical aspects to support your learning.
Designed for graduate students in physics, materials science, chemistry, nanoscience, and engineering.
Serves as a helpful introductory resource for researchers who are new to the field of scanning probe microscopy.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 3662452391
- Category
- Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electrical > Nanotechnology
- Domain
- Amazon UK
- Release Date
- 23 March 2015
- Listed Since
- 18 September 2014
Barcode
No barcode data available
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