Noncontact Atomic Force Microscopy (NanoScience and Technology) - Image 1

£149.64

Springer Noncontact Atomic Force Microscopy (NanoScience and Technology)

Name: Noncontact Atomic Force Microscopy (NanoScience and Technology)
Brand: Springer
Price: 149.64 GBP
Availability: InStock

Nanotechnology

This is the usual price. Wait for it to drop, or tell us your number.

£150 today · usual range £0–£0 · best ever £139

NEW HERE?

Amazon shows you one price. We show you all of them.

Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.

WHAT'S ON THIS PAGE

↓ Price chart
when this has been cheap or pricey

↓ Forecast
where the price is heading next

↓ Statistics
all-time high & low, recent range

↑ Price alert
name your number, we'll email you

Price History & Forecast

Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.

Last 585 days • 585 data points (No recent data available)

Historical

Generating forecast...

Price Distribution

Price distribution over 585 days • 3 price ranges

Days at Price

Current Price

Price Analysis

Most common range: £139-147 (505 days, 86.3%)

Price range: £139 - £180

Price levels: 3 price ranges over 585 days

Description

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues. Review "This book gives a comprehensive overview of the state-of-the-art of this dynamic force microscopy technique in 20 chapters, each written by experts in the field. It covers the theoretical basis, as well as applications to semiconducting surfaces, ionic crystals, metal oxides, and organic molecular systems including thin films, polymers, and nucleic acids . . . There are unsolved questions about the mechanisms responsible for atomic resolution but, as this well-written book displays, there has been tremendous progress in basic understanding of the technique and fascinating new applications continue to arise . . . With an increased understanding of NC-AFM, as demonstrated in this book, we are certain to see further progress in the near future." –Materials Today From the Back Cover Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Product Specifications

Brand: Springer
Format: paperback
ASIN: 3642627722
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electrical > Nanotechnology
Domain: Amazon UK
Publication Date: 23 October 2012
Listed Since: 03 March 2013

Barcode

No barcode data available

Springer Noncontact Atomic Force Microscopy (NanoScience and Technology)

This is the usual price. Wait for it to drop, or tell us your number.

Price History & Forecast

Price Distribution

Price Analysis

Description

Product Specifications

Barcode

Similar Products You Might Like

Springer Noncontact Atomic Force Microscopy: Volume 2 Book

Atomic Force Microscopy

Noncontact Atomic Force Microscopy: Volume 2 (NanoScience and Technology)

Noncontact Atomic Force Microscopy: Volume 3 (NanoScience and Technology)

Noncontact Atomic Force Microscopy: Volume 3 (NanoScience and Technology)

Nova Science AFM Principles, Modes & Limitations Book

Electrical Atomic Force Microscopy for Nanoelectronics (NanoScience and Technology)

Atomic Force Microscopy: Fundamental Concepts and Laboratory Investigations

Atomic Force Microscopy For Biologists (2nd Edition)

Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

Atomic Force Microscopy: Fundamental Concepts and Laboratory Investigations

Scanning Force Microscopy of Polymers (Springer Laboratory)

Atomic Force Microscopy in Cell Biology Volume 68

Atomic Force Microscopy (NanoScience and Technology)

Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)

Scanning Probe Microscopy in Nanoscience and Nanotechnology: 1 (NanoScience and Technology)

Applied Scanning Probe Methods XII: Characterization (NanoScience and Technology)

Atomic Force Microscopy in Cell Biology: 68 (Methods in Cell Biology): Volume 68

Applied Scanning Probe Methods IX: Characterization (NanoScience and Technology)

Life at the Nanoscale: Atomic Force Microscopy of Live Cells

Applied Scanning Probe Methods X: Biomimetics and Industrial Applications (NanoScience and Technology)

Atomic Force Microscopy in Adhesion Studies