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Springer Atomic Force Microscopy - NanoScience and Technology Guide

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Description

This comprehensive guide explains the operating principles of atomic force microscopy, enabling readers to operate scanning probe microscopes successfully and interpret their data effectively. The enhanced second edition represents a substantial extension and revision of the previous Scanning Probe Microscopy book from Springer (2015), covering both fundamental and advanced technical aspects of atomic force microscopy. Written with a didactic approach, the book presents complex nanotechnology principles in an easily digestible manner, making it suitable for researchers, engineers, and students working with atomic force microscopy equipment. The book bridges theory and practical application, helping readers understand the underlying mechanisms that drive scanning probe microscopy performance and data analysis.

Key Features

Springer's enhanced second edition provides substantial revisions and extensions to atomic force microscopy content compared to the original 2015 Scanning Probe Microscopy book.

The book covers both fundamental principles and important technical aspects of atomic force microscopy using a didactic teaching approach.

Designed to help readers operate scanning probe microscopes successfully and understand the data obtained from atomic force microscopy measurements.

Part of the NanoScience and Technology series, offering expertise in nanotechnology and electrical engineering applications of atomic force microscopy.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
14 August 2020
Listed Since
09 June 2020

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No barcode data available

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