£120.83

Springer Atomic Force Microscopy - NanoScience and Technology

Name: Springer Atomic Force Microscopy - NanoScience and Technology
Brand: Springer
Price: 120.83 GBP
Availability: InStock

Technical

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Description

Master the complexities of scanning probe microscopy with this comprehensive guide from Springer. This enhanced second edition provides a deep dive into the operating principles of atomic force microscopy, designed to help you operate a microscope successfully and interpret your research data with confidence. Building upon the foundation of the 2015 Scanning Probe Microscopy text, this updated volume offers a substantial extension and revision specifically focused on atomic force microscopy. It serves as an essential resource for students and professionals working in nanoscience and technology, bridging the gap between theoretical physics and practical application. By using a didactic approach, the book breaks down both fundamental concepts and important technical aspects. Whether you are a researcher looking to refine your data analysis or a student learning the basics of scanning probe methods, this text provides the clarity needed to navigate the field of nanotechnology effectively.

Key Features

Comprehensive operating principles to help you successfully manage and operate a scanning probe microscope in a laboratory setting.

Detailed guidance on understanding and interpreting the data obtained from your microscopy sessions for accurate research results.

Substantial revisions and extensions from the 2015 edition, providing updated information on atomic force microscopy techniques.

A didactic approach that makes complex technical aspects and fundamental methods easier to learn and apply.

Focused coverage of both the basic theory and the technical requirements necessary for advanced nanoscience research.

Product Specifications

Brand: Springer
Format: paperback
ASIN: 3030136566
Category: Books > Subjects > Reference > Writing > Technical
Domain: Amazon UK
Release Date: 14 August 2020
Listed Since: 09 June 2020

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Springer Atomic Force Microscopy - NanoScience and Technology

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