We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£73.42
It has never been this cheap. We have no record of a lower price.
£73 today · cheaper than every other day in the last 3 months
Springer Scanning Microscopy: Symposium Proceedings (ESPRIT Basic Research Series)
We'll watch every seller, every day. One email when your price arrives.
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 51 days · 51 data points (no recent data)
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price Distribution
Price distribution over 51 days • 2 price levels
Price Analysis
Most common price: £75 (45 days, 88.2%)
Price range: £73 - £75
Price levels: 2 different prices over 51 days
Description
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 3642848125
- Domain
- Amazon UK
- Release Date
- 09 February 2012
- Listed Since
- 12 July 2012
Barcode
No barcode data available
Similar Products You Might Like
SCANNING PROBE MICROSCOPY
World Scientific Publishing Company
Scanning Probe Microscopy
World Scientific Publishing Company
Hybridizing Surface Probe Microscopies: Toward a Full Description of the Meso- and Nanoworlds
CRC Press
Oxford University Press - Introduction to Scanning Tunneling Microscopy
Oxford University Press
Electron Beam-Specimen Interactions and Simulation Methods in Microscopy (RMS - Royal Microscopical Society)
Wiley
EMC 2008: Vol 2: Materials Science
Springer
In-Situ Transmission Electron Microscopy Experiments: Design and Practice
Wiley
Nanoscale Science and Technology: Proceedings of the NATO Advanced Research Workshop, Toledo, Spain, May 11-16, 1997: v. 348 (NATO Science Series E:)
Springer
Principles of Analytical Electron Microscopy
Springer
Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
Springer
Principles Electron Microscopy 2ed
Cambridge University Press
Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications
CRC Press
Advances in Imaging and Electron Physics Volume 153 - Aberration-corrected Microscopy
Elsevier
Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications
CRC Press
Atomic Force Microscopy - NanoScience and Technology Guide
Springer
Microanalysis of Solids
Springer
IN-SITU ELECTRON MICROSCOPY AT HIGH RESOLUTION
World Scientific Publishing Company
Scanning Probe Microscopy: The Lab on a Tip (Graduate Texts in Physics)
Springer
Applied Scanning Probe Methods XII: Characterization (NanoScience and Technology)
Springer
Biomineralization Sourcebook: Characterization of Biominerals and Biomimetic Materials
CRC Press