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£163.19
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Elsevier Advances in Imaging and Electron Physics Volume 153 - Aberration-corrected Microscopy
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Description
Key Features
Volume 153 in the Advances in Imaging and Electron Physics series focuses specifically on aberration-corrected microscopy techniques and applications.
Covers the historical development of electron microscopy over more than 70 years and its transformative impact on biological and materials science research.
Addresses the resolution limits of traditional microscopy and presents methods for overcoming aberrations to achieve atomic-scale observation capabilities.
Published by Academic Press, a trusted academic publisher specialising in technical and scientific literature for advanced researchers and professionals.
Product Specifications
- Brand
- Elsevier
- Format
- hardcover
- ASIN
- 012374220X
- Domain
- Amazon UK
- Release Date
- 15 December 2008
- Listed Since
- 19 May 2008
Barcode
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