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Academic Press Aberration-corrected Microscopy Volume 153

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Description

Explore the evolution of microscopic technology with Advances in Imaging and Electron Physics: Aberration-corrected Microscopy. This volume 153 from the Electron Microscopy series provides a deep look into how scientists overcome the traditional limits of resolution. For over 70 years, the electron microscope has allowed biologists to study viruses and cell components, and enabled materials scientists to examine the structure of metals, alloys, and other substances. However, reaching the level of true atomic structure required new advancements to bypass previous technical boundaries. This text addresses those developments, offering essential knowledge for those studying the fine details of the microscopic world. It serves as a vital resource for researchers looking to understand the transition from standard electron microscopy to advanced aberration-corrected techniques.

Key Features

Covers the historical development of electron microscopy from its invention over 70 years ago to modern advancements.

Provides technical context on the limit of resolution that previously restricted direct observation of atomic structures.

Explores applications for biologists studying viruses and the specific components of cells.

Offers insights for materials scientists examining the structure and defects of metals and alloys.

Part of the specialized Advances in Imaging and Electron Physics series by Academic Press.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
15 December 2008
Listed Since
19 May 2008

Barcode

No barcode data available

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