£95.89

Springer Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization: 65 (Springer Series in Surface Sciences, 65)

Price data last checked 17 day(s) ago - will refresh soon

View at Amazon

We'll watch every seller, every day. One email when your price arrives.

It has never been this cheap. We have no record of a lower price.

£96 today · cheaper than every other day in the last 3 months

NEW HERE?

Amazon shows you one price. We show you all of them.

Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.

WHAT'S ON THIS PAGE

↓ Price chart
when this has been cheap or pricey
↓ Forecast
where the price is heading next
↓ Statistics
all-time high & low, recent range
↑ Price alert
name your number, we'll email you

Price History & Forecast

Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.

Last 74 days · 74 data points (no recent data)

Historical
Generating forecast…
£123.27 £93.15 £99.72 £106.29 £112.87 £119.44 £126.01 28 April 2026 16 May 2026 03 June 2026 21 June 2026 10 July 2026

Price Distribution

Price distribution over 74 days • 6 price levels

Days at Price
Current Price
1 day · current 11 days 20 days 16 days 23 days 3 days 0 6 12 17 23 £96 £98 £102 £106 £117 £123 Days at Price

Price Analysis

Most common price: £117 (23 days, 31.1%)

Price range: £96 - £123

Price levels: 6 different prices over 74 days

Description

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
19 March 2018
Listed Since
18 January 2018

Barcode

No barcode data available

Similar Products You Might Like

Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces: 48 (Springer Series in Surface Sciences, 48)
99% match

Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces: 48 (Springer Series in Surface Sciences, 48)

Springer

£73.59 17 Jul 2026
Atomic Force Microscopy (NanoScience and Technology)
96% match

Atomic Force Microscopy (NanoScience and Technology)

Springer

£117.12 18 Jun 2026
Forces in Scanning Probe Methods: 286 (NATO Science Series E:, 286)
95% match

Forces in Scanning Probe Methods: 286 (NATO Science Series E:, 286)

Springer

£220.51 11 Jun 2026
Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation
95% match

Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation

Springer

£65.57 22 Jun 2026
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
95% match

Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

Springer

£104.20 13 Jun 2026
Springer Applied Scanning Probe Methods I - NanoScience Book
95% match

Springer Applied Scanning Probe Methods I - NanoScience Book

Springer

£123.97 17 Jul 2026
Springer Atomic Force Microscopy - NanoScience and Technology
95% match

Springer Atomic Force Microscopy - NanoScience and Technology

Springer

£120.83 16 Jul 2026
Springer Scanning Probe Microscopy - AFM and STM Textbook
95% match

Springer Scanning Probe Microscopy - AFM and STM Textbook

Springer

£91.38 25 May 2026
Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (NanoScience and Technology)
95% match

Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (NanoScience and Technology)

Springer

£133.39 13 Jun 2026
Noncontact Atomic Force Microscopy: Volume 3 (NanoScience and Technology)
95% match

Noncontact Atomic Force Microscopy: Volume 3 (NanoScience and Technology)

Springer

£143.44 08 Jul 2026
Noncontact Atomic Force Microscopy: Volume 3 (NanoScience and Technology)
95% match

Noncontact Atomic Force Microscopy: Volume 3 (NanoScience and Technology)

Springer

£145.02 10 Jun 2026
Nanoscale Probes of the Solid/Liquid Interface: 288 (NATO Science Series E:, 288)
95% match

Nanoscale Probes of the Solid/Liquid Interface: 288 (NATO Science Series E:, 288)

Springer

£147.08 30 Jun 2026
Nanoscale Probes of the Solid/Liquid Interface: 288 (NATO Science Series E:, 288)
95% match

Nanoscale Probes of the Solid/Liquid Interface: 288 (NATO Science Series E:, 288)

Springer

£159.63 29 Jun 2026
Applied Scanning Probe Methods IX: Characterization (NanoScience and Technology)
95% match

Applied Scanning Probe Methods IX: Characterization (NanoScience and Technology)

Springer

£82.10 09 Jul 2026
Scanning Probe Microscopy: Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device ... II: Mathematics, Physics and Chemistry, 186)
95% match

Scanning Probe Microscopy: Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device ... II: Mathematics, Physics and Chemistry, 186)

Springer

£235.43 11 Jun 2026
Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques (NanoScience and Technology)
95% match

Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques (NanoScience and Technology)

Springer

£81.54 17 Jul 2026
SCANNING PROBE MICROSCOPY FOR ENERGY RESEARCH: MATERIALS, DEVICES, AND APPLICATIONS: 7 (World Scientific Series in Nanoscience and Nanotechnology)
95% match

SCANNING PROBE MICROSCOPY FOR ENERGY RESEARCH: MATERIALS, DEVICES, AND APPLICATIONS: 7 (World Scientific Series in Nanoscience and Nanotechnology)

World Scientific Publishing Company

£77.06 07 Jul 2026
Atomic Force Microscopy: Fundamental Concepts and Laboratory Investigations
95% match

Atomic Force Microscopy: Fundamental Concepts and Laboratory Investigations

CRC Press

£93.15 06 Jul 2026
SCANNING PROBE MICROSCOPY
95% match

SCANNING PROBE MICROSCOPY

World Scientific Publishing Company

£44.10 04 Jul 2026
Applied Scanning Probe Methods X: Biomimetics and Industrial Applications (NanoScience and Technology)
95% match

Applied Scanning Probe Methods X: Biomimetics and Industrial Applications (NanoScience and Technology)

Springer

£81.84 07 Jul 2026
Photoelectron Spectroscopy: Bulk and Surface Electronic Structures: 72 (Springer Series in Surface Sciences, 72)
95% match

Photoelectron Spectroscopy: Bulk and Surface Electronic Structures: 72 (Springer Series in Surface Sciences, 72)

Springer

£99.03 15 Jul 2026
Photoelectron Spectroscopy: Bulk and Surface Electronic Structures: 72 (Springer Series in Surface Sciences, 72)
95% match

Photoelectron Spectroscopy: Bulk and Surface Electronic Structures: 72 (Springer Series in Surface Sciences, 72)

Springer

£73.28 15 Jul 2026
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization: 65 (Springer Series in Surface Sciences, 65)
95% match

Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization: 65 (Springer Series in Surface Sciences, 65)

Springer

£159.99 02 Jul 2026
Atomic Force Microscopy: Fundamental Concepts and Laboratory Investigations
94% match

Atomic Force Microscopy: Fundamental Concepts and Laboratory Investigations

CRC Press

£77.62 15 Jul 2026