We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£146.12
Springer Advanced X-ray Crystallography: 315 (Topics in Current Chemistry, 315)
Price data last checked 80 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
This is the most expensive it has ever been. Walk away.
£146 today · previous high £146 · all-time low £144
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 11 days · 11 data points (no recent data)
Price Distribution
Price distribution over 11 days • 2 price levels
Price Analysis
Most common price: £144 (10 days, 90.9%)
Price range: £144 - £146
Price levels: 2 different prices over 11 days
Description
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 3642274064
- Domain
- Amazon UK
- Release Date
- 13 January 2012
- Listed Since
- 24 November 2011
Barcode
No barcode data available
Similar Products You Might Like
Advanced X-ray Crystallography: 315 (Topics in Current Chemistry, 315)
Springer
Intro X-Ray Crystallography 2ed
Cambridge University Press
The Essence Of Crystallography: 0 (Essential Textbooks in Chemistry)
World Scientific Publishing Company
High Resolution X-Ray Diffractometry And Topography
CRC Press
Resonant X-Ray Scattering in Correlated Systems: 269 (Springer Tracts in Modern Physics, 269)
Springer
X-Ray Diffraction: A Practical Approach
Springer
Structure Determination by X-ray Crystallography
Springer
High Resolution X-Ray Diffractometry And Topography
CRC Press
Springer X-Ray Spectroscopy for Chemical State Analysis Book
Springer
Structure Determination by X-ray Crystallography
Springer
Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications: 183 (Springer Series in Materials Science, 183)
Springer
Structure Determination by X-ray Crystallography
Springer
Resonant X-Ray Scattering in Correlated Systems: 269 (Springer Tracts in Modern Physics, 269)
Springer
X-ray Scattering From Semiconductors And Other Materials (3rd Edition)
World Scientific Publishing Company
X-Ray Diffraction Procedures: For Polycrystalline and Amorphous Materials (Wiley-Interscience Publication)
Wiley
Indexing of Crystal Diffraction Patterns: From Crystallography Basics to Methods of Automatic Indexing: 326 (Springer Series in Materials Science, 326)
Springer
Oxford University Press - Dynamical Theory of X-Ray Diffraction
Oxford University Press
High-Z Materials for X-ray Detection: Material Properties and Characterization Techniques
Springer
X-Ray Diffraction by Disordered Lamellar Structures: Theory and Applications to Microdivided Silicates and Carbons
Springer
Basic Crystallography+D3
Wiley
X-Ray Diffraction: Modern Experimental Techniques
Taylor & Francis
STRUC DET FROM POWDER DIFFRACTION DATA IUCRMC:NCS 13 PAPER (International Union of Crystallography Monographs on Crystallography)
Oxford University Press
Diffuse X-ray Scattering and Models of Disorder: 31 (International Union of Crystallography Monographs on Crystallography)
Oxford University Press
X-ray Scattering From Semiconductors (2nd Edition) - Imperial College
Imperial College Press