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Elsevier Advances in Optics of Charged Particle Analyzers: Part 1: Volume 232 (Advances in Imaging and Electron Physics, Volume 232)

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£179.89 £168.67 £171.12 £173.57 £176.01 £178.46 £180.91 25 July 2026 09 August 2026 25 August 2026 09 September 2026 25 September 2026
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Description
Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics series

Product Specifications
Brand
Elsevier
Format
hardcover
ASIN
044329786X
Category
Books > Subjects > Computing & Internet > Computer Science
Domain
Amazon UK
Release Date
25 November 2024
Listed Since
08 March 2024

Barcode

No barcode data available

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