Advances in Optics of Charged Particle Analyzers: Part 1: Volume 232 (Advances in Imaging and Electron Physics, Volume 232) - Image 1

£169.69

Academic Press Advances in Optics of Charged Particle Analyzers: Part 1: Volume 232 (Advances in Imaging and Electron Physics, Volume 232)

Name: Advances in Optics of Charged Particle Analyzers: Part 1: Volume 232 (Advances in Imaging and Electron Physics, Volume 232)
Brand: Academic Press
Price: 169.69 GBP
Availability: InStock

Computer Science

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Description

Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics series

Product Specifications

Brand: Academic Press
Format: hardcover
ASIN: 044329786X
Category: Books > Subjects > Computing & Internet > Computer Science
Domain: Amazon UK
Release Date: 25 November 2024
Listed Since: 08 March 2024

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Academic Press Advances in Optics of Charged Particle Analyzers: Part 1: Volume 232 (Advances in Imaging and Electron Physics, Volume 232)

New to our records — first sighting 24 days ago. We'll learn its rhythm.

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