£134.37

Academic Press - Optics of Charged Particle Analyzers Vol 162

Name: Academic Press - Optics of Charged Particle Analyzers Vol 162
Brand: Academic Press
Price: 132.77 GBP
Availability: InStock

Computer Science

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Description

Advances in Imaging and Electron Physics: Volume 162 provides a deep look into the Optics of Charged Particle Analyzers. This specialized volume is part of a series that merges two established serials: Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This text covers a wide range of technical subjects including particle optics at both high and low energies, semiconductor device physics, and microlithography. Readers will find detailed information on image science, digital image processing, and electromagnetic wave propagation. The content also addresses electron microscopy and the specific computing methods used across these scientific domains. By featuring contributions from international scholars and industry experts, this volume presents research on hot topic areas within the field. It serves as a comprehensive resource for those studying electron devices and the physics behind advanced imaging technologies.

Key Features

Covers essential topics such as particle optics at high and low energies for advanced research applications.

Includes detailed studies on semiconductor devices and the physics of electron devices.

Provides technical insights into microlithography, image science, and digital image processing methods.

Explores electromagnetic wave propagation and electron microscopy for scientific study.

Discusses various computing methods used within the domains of imaging and electron physics.

Features professional contributions from leading international scholars and industry experts.

Product Specifications

Brand: Academic Press
Format: hardcover
ASIN: 0123813166
Category: Books > Subjects > Computing & Internet > Computer Science
Domain: Amazon UK
Release Date: 06 August 2010
Listed Since: 24 August 2009

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Academic Press - Optics of Charged Particle Analyzers Vol 162

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