£135.76

Academic Press - Optics of Charged Particle Analyzers Vol 164

Name: Academic Press - Optics of Charged Particle Analyzers Vol 164
Brand: Academic Press
Price: 135.76 GBP
Availability: InStock

Computer Science

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Description

Advances in Imaging and Electron Physics, Volume 164, provides a deep look into the optics of charged particle analyzers. This specialized volume is part of a series that merges two long-running serials: Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This text serves as a resource for understanding the physics of electron devices, specifically semiconductor devices, and particle optics at both high and low energies. It covers essential topics including microlithography, image science, digital image processing, and electromagnetic wave propagation. Readers can also find information on electron microscopy and the various computing methods used across these scientific domains. Contributions come from leading international scholars and industry experts, ensuring that the material covers hot topic areas in the field. Whether you are researching electron microscopy or electromagnetic wave propagation, this volume provides the technical depth required for advanced study in imaging and electron physics.

Key Features

Covers essential topics in particle optics at both high and low energy levels.

Provides detailed information on the physics of electron devices and semiconductor devices.

Includes technical discussions on microlithography and digital image processing.

Explores electromagnetic wave propagation and electron microscopy techniques.

Features insights on computing methods used throughout these scientific domains.

Contains contributions from leading international scholars and industry experts.

Product Specifications

Brand: Academic Press
Format: hardcover
ASIN: 0123813123
Category: Books > Subjects > Computing & Internet > Computer Science
Domain: Amazon UK
Release Date: 06 December 2010
Listed Since: 28 August 2009

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Academic Press - Optics of Charged Particle Analyzers Vol 164

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