Theory of Intense Beams of Charged Particles: 166 (Advances in Imaging and Electron Physics) (Advances in Imaging and Electron Physics, Volume 166) - Image 1

£130.00

Academic Press Theory of Intense Beams of Charged Particles: 166 (Advances in Imaging and Electron Physics) (Advances in Imaging and Electron Physics, Volume 166)

Name: Theory of Intense Beams of Charged Particles: 166 (Advances in Imaging and Electron Physics) (Advances in Imaging and Electron Physics, Volume 166)
Brand: Academic Press
Price: 130.0 GBP
Availability: InStock

Applied Optics

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Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians

Product Specifications

Brand: Academic Press
Format: hardcover
ASIN: 0123813107
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electronics & Communications Engineering > Electronics Engineering > Applied Optics
Domain: Amazon UK
Release Date: 21 June 2011
Listed Since: 28 August 2009

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Academic Press Theory of Intense Beams of Charged Particles: 166 (Advances in Imaging and Electron Physics) (Advances in Imaging and Electron Physics, Volume 166)

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