£135.76

Academic Press : Optics of Charged Particle Analyzers Vol 161

Name: Academic Press: Optics of Charged Particle Analyzers Vol 161
Brand: Academic Press
Price: 135.76 GBP
Availability: InStock

Computer Science

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Description

Advances in Imaging and Electron Physics: Volume 161 provides a deep look into the Optics of Charged Particle Analyzers. This specialized volume is part of a series that merges the long-running serials Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This book offers extended articles covering essential topics in physics, including particle optics at both high and low energies, electron microscopy, and semiconductor device physics. It is designed for researchers and professionals interested in microlithography, electromagnetic wave propagation, and image science. Readers can explore digital image processing and the computing methods used throughout these scientific domains. By bringing together contributions from leading international scholars and industry experts, this volume addresses hot topic areas in the field. It serves as a comprehensive resource for understanding the physics of electron devices and the technical advancements driving modern imaging and electron physics.

Key Features

Comprehensive coverage of particle optics at both high and low energy levels for advanced research applications.

Includes detailed studies on electron microscopy and the physics of semiconductor devices.

Explores modern advancements in microlithography and electromagnetic wave propagation.

Provides insight into digital image processing and essential image science techniques.

Features technical discussions on computing methods used across various electron physics domains.

Contains expert contributions from leading international scholars and industry professionals.

Product Specifications

Brand: Academic Press
Format: hardcover
ASIN: 0123813182
Category: Books > Subjects > Computing & Internet > Computer Science
Domain: Amazon UK
Release Date: 06 May 2010
Listed Since: 24 August 2009

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Academic Press : Optics of Charged Particle Analyzers Vol 161

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