£135.33

Academic Press Optics of Charged Particle Analyzers Vol 160

Name: Academic Press Optics of Charged Particle Analyzers Vol 160
Brand: Academic Press
Price: 132.77 GBP
Availability: InStock

Computer Science

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Description

Advances in Imaging and Electron Physics: Volume 160 provides specialized knowledge on the optics of charged particle analyzers. This volume is part of a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy, to create a comprehensive resource for researchers and professionals. The text covers a wide range of technical domains, including particle optics at both high and low energies, electron microscopy, and electromagnetic wave propagation. It also addresses modern requirements such as digital image processing, microlithography, and the computing methods used across these scientific fields. By featuring contributions from leading international scholars and industry experts, this book serves as a deep dive into the physics of electron devices and semiconductor devices. It is designed for those working in image science and the complex computational methods required for modern electron physics research.

Key Features

Covers particle optics at both high and low energy levels for specialized research applications.

Includes detailed discussions on the physics of electron devices and semiconductor devices.

Explores essential topics in image science and digital image processing techniques.

Provides insights into electromagnetic wave propagation and electron microscopy.

Features contributions from leading international scholars and industry experts in the field.

Addresses modern computing methods used in electron physics and image science domains.

Product Specifications

Brand: Academic Press
Format: hardcover
ASIN: 0123810175
Category: Books > Subjects > Computing & Internet > Computer Science
Domain: Amazon UK
Release Date: 08 April 2010
Listed Since: 28 August 2009

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Academic Press Optics of Charged Particle Analyzers Vol 160

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