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£109.09
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£109 today · previous high £109 · all-time low £106
Springer Long-Term Reliability of Nanometer VLSI Systems - Springer
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Price distribution over 75 days • 2 price levels
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Most common price: £109 (66 days, 88.0%)
Price range: £106 - £109
Price levels: 2 different prices over 75 days
Description
Key Features
Covers electromigration and biased temperature instability as primary long-term reliability concerns in nanometer VLSI systems.
Provides physics-based electromigration modelling approaches for multi-layer interconnect structures in advanced integrated circuits.
Addresses reliability analysis and optimisation techniques across circuit, architecture and system levels of design abstraction.
Discusses BTI effects on CMOS devices and strategies to mitigate temperature-induced performance degradation.
Offers practical insights into modelling and predicting electromigration-induced failures in nanometer-scale semiconductor systems.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 3030261719
- Category
- Books > Subjects > Computing & Internet > Computer Science > Architecture & Microprocessors
- Domain
- Amazon UK
- Release Date
- 25 September 2019
- Listed Since
- 22 June 2019
Barcode
No barcode data available
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