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£108.62
Springer - Long-Term Reliability of Nanometer VLSI Systems
Price data last checked 53 day(s) ago - refreshing...
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Last 38 days • 38 data points (No recent data available)
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Price distribution over 38 days • 1 price levels
Price Analysis
Most common price: £109 (38 days, 100.0%)
Price range: £109 - £109
Price levels: 1 different prices over 38 days
Description
Key Features
Covers critical aging effects including electromigration (EM) for interconnects and biased temperature instability (BTI) for CMOS devices.
Provides detailed analysis of reliability effects at the circuit, architecture, and system levels of abstraction.
Includes information on recently developed physics-based EM modeling to improve system accuracy.
Serves as a detailed reference for the modeling, analysis, and optimization of nanometer integrated systems.
Focuses on the practical implications of EM and BTI induced failures in modern semiconductor technology.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 3030261719
- Category
- Books > Subjects > Computing & Internet > Computer Science > Architecture & Microprocessors
- Domain
- Amazon UK
- Release Date
- 25 September 2019
- Listed Since
- 22 June 2019
Barcode
No barcode data available
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