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£49.66
Springer - Long-Term Reliability of Nanometer VLSI Systems
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Price distribution over 48 days • 2 price levels
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Most common price: £109 (47 days, 97.9%)
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Description
Key Features
Covers critical aging effects including electromigration (EM) for interconnects and biased temperature instability (BTI) for CMOS devices.
Provides detailed analysis of reliability effects at the circuit, architecture, and system levels of abstraction.
Includes information on recently developed physics-based EM modeling to improve system accuracy.
Serves as a detailed reference for the modeling, analysis, and optimization of nanometer integrated systems.
Focuses on the practical implications of EM and BTI induced failures in modern semiconductor technology.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 3030261719
- Category
- Books > Subjects > Computing & Internet > Computer Science > Architecture & Microprocessors
- Domain
- Amazon UK
- Release Date
- 25 September 2019
- Listed Since
- 22 June 2019
Barcode
No barcode data available
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