We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£79.34
Springer Advanced X-ray Imaging of Electrochemical Energy Materials and Devices
Price data last checked 41 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£79 today · cheaper than every other day in the last 3 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 50 days · 50 data points (no recent data)
Price Distribution
Price distribution over 50 days • 5 price levels
Price Analysis
Most common price: £83 (29 days, 58.0%)
Price range: £79 - £88
Price levels: 5 different prices over 50 days
Description
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 9811653275
- Domain
- Amazon UK
- Release Date
- 03 October 2021
- Listed Since
- 09 July 2021
Barcode
No barcode data available
Similar Products You Might Like
Springer X-Ray Spectroscopy for Chemical State Analysis Book
Springer
Synchrotron Techniques in Interfacial Electrochemistry: 432 (Nato Science Series C:, 432)
Springer
Synchrotron Techniques in Interfacial Electrochemistry: 432 (Nato Science Series C:, 432)
Springer
Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications: 183 (Springer Series in Materials Science, 183)
Springer
High-Z Materials for X-ray Detection: Material Properties and Characterization Techniques
Springer
X-ray Scattering from Semiconductors
Imperial College Press
X-Ray Line Profile Analysis in Materials Science (Research Essentials)
IGI Global
Two-dimensional X-ray Diffraction
Wiley
In-situ Materials Characterization: Across Spatial and Temporal Scales: 193 (Springer Series in Materials Science, 193)
Springer
A Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis (Statistics)
Wiley
High Resolution X-Ray Diffractometry And Topography
CRC Press
X-ray and Electron Diffraction Studies in Materials Science (Matsci)
CRC Press
High Resolution X-Ray Diffractometry And Topography
CRC Press
X-Ray Scattering (Materials Science and Technologies) Book
X-ray Scattering From Semiconductors And Other Materials (3rd Edition)
World Scientific Publishing Company
Energy Dispersive X-ray Analysis in the Electron Microscope: 49 (Microscopy Handbooks)
Routledge
Characterization of Advanced Materials
Springer
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)
CRC Press
Advanced X-ray Detector Technologies: Design and Applications
Springer
Advances in X-Ray Analysis: Volume 38
Springer
X-ray Microscopy (Advances in Microscopy and Microanalysis)
Cambridge University Press
Advanced X-ray Crystallography: 315 (Topics in Current Chemistry, 315)
Springer
X-Ray Photoelectron Spectroscopy of Solid Surfaces
CRC Press
X-Ray Diffraction Imaging: Technology and Applications (Devices, Circuits, and Systems)
CRC Press