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Cambridge University Press Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Amazon

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£126.00 £90.80 £98.48 £106.16 £113.84 £121.52 £129.20 28 July 2026 16 August 2026 04 September 2026 23 September 2026 12 October 2026
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Price range: £94 - £126

Price levels: 3 different prices over 77 days

Description

In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
23 May 1996
Listed Since
22 January 2007

Barcode

No barcode data available

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