We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£92.89
Cambridge University Press - Reflection High-Energy Electron Diffraction
Price data last checked 34 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£93 today · cheaper than every other day in the last 3 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 57 days • 57 data points (No recent data available)
Price Distribution
Price distribution over 57 days • 2 price levels
Price Analysis
Most common price: £93 (54 days, 94.7%)
Price range: £93 - £131
Price levels: 2 different prices over 57 days
Description
Key Features
Comprehensive coverage of RHEED principles designed to help beginners understand the fundamentals of electron diffraction.
Practical pattern interpretation through many descriptive examples to assist in accurate surface characterization.
Advanced theoretical and experimental treatments tailored to meet the needs of experienced experts in the field.
Specialized focus on thin film growth during molecular beam epitaxy and surface morphology analysis.
Detailed guidance on analyzing RHEED patterns to ensure precise scientific results in your research.
Product Specifications
- Format
- hardcover
- ASIN
- 0521453739
- Domain
- Amazon UK
- Release Date
- 13 December 2004
- Listed Since
- 22 December 2006
Barcode
No barcode data available
Similar Products You Might Like
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Cambridge University Press
Topics in Electron Diffraction and Microscopy of Materials (Series in Microscopy in Materials Science)
CRC Press
Woodhead Publishing - In-Situ Characterisation of Thin Film Growth
Woodhead Publishing
Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects
CRC Press
Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects
CRC Press
Electron Backscatter Diffraction in Materials Science
Springer
In Situ Real–Time Characterization of Thin Films
Wiley-Blackwell
High Resolution X-Ray Diffractometry And Topography
CRC Press
High Resolution X-Ray Diffractometry And Topography
CRC Press
Surface Structure Determination by LEED and X-rays
Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications
CRC Press
Electrohydrodynamic Patterning of Functional Materials (Springer Theses)
Springer
Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications
CRC Press
CRC Press Optics for Materials Scientists - Academic Textbook
CRC Press
Time Resolved Electron Diffraction: for Chemistry, Biology and Material Science (Advances in Imaging and Electron Physics): Volume 184
Academic Press
Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)
Springer
Electrohydrodynamic Patterning of Functional Materials (Springer Theses)
Springer
Heteroepitaxy of Semiconductors: Theory, Growth, and Characterization, Second Edition
CRC Press
Springer Diffraction Analysis of Microstructure of Materials 68
Springer
Diffraction Analysis of the Microstructure of Materials: 68 (Springer Series in Materials Science, 68)
Springer
Optics for Materials Scientists
CRC Press
Strain And Dislocation Gradients From Diffraction: Spatially-Resolved Local Structure And Defects
Imperial College Press
Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience
Springer
Uniting Electron Crystallography and Powder Diffraction (NATO Science for Peace and Security Series B: Physics and Biophysics)
Springer