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Springer Micro-X-Ray Fluorescence Spectroscopy Book - Vol 55

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Description

Explore the advanced principles of Micro-X-ray fluorescence spectroscopy with this comprehensive volume from the Springer Series in Surface Sciences. This text covers position-sensitive and non-destructive analysis techniques essential for studying non-homogeneous materials and layer systems. As the field has developed over the last 15 years, the need for laboratory-based instruments has grown to provide fast, immediate access to analytical results. This book details how the technique is used for the analysis of small particles, inclusions, and elemental distributions. It serves as a valuable resource for both research applications and quality control environments, bridging the gap between synchrotron experiments and practical laboratory use.

Key Features

This Springer publication provides detailed information on position-sensitive and non-destructive analysis for non-homogeneous materials.

The text covers the application of Micro-X-ray fluorescence for analyzing small particles and inclusions.

Learn about the use of elemental distributions in various research and quality control applications.

This volume is part of the Springer Series in Surface Sciences, specifically number 55.

The book addresses the transition from synchrotron experiments to practical laboratory instrument requirements.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
22 May 2014
Listed Since
09 January 2014

Barcode

No barcode data available

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