£89.61

Springer - Low-Frequency Noise in Advanced MOS Devices

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Description

Gain a deep understanding of noise mechanisms in modern semiconductor technology with this technical resource from Springer. This book provides a comprehensive look at low-frequency noise in advanced MOS devices, making it an essential reference for engineers and researchers working with analog circuits and signal processing. The text starts with a clear introduction to noise, covering fundamental noise sources and the basics of circuit analysis. It offers detailed discussions on the characterization of low-frequency noise, providing practical advice for real-world applications. Readers will find extensive treatment of various theoretical and compact 1/f noise models used in MOS transistors. This guide covers advanced CMOS technology, including nanometer scaled devices, strained Si, SiGe, SOI, and high-k gate dielectrics. It is designed to help professionals understand the potential sources of noise and the underlying mechanisms that impact device performance in cutting-edge manufacturing processes.

Key Features

Covers fundamental noise sources and basic circuit analysis to build a strong technical foundation.

Provides detailed characterization of low-frequency noise along with practical advice for implementation.

Explains various theoretical and compact 1/f noise models for MOS transistors in depth.

Addresses advanced CMOS technology including nanometer scaled devices and high-k gate dielectrics.

Includes technical details on strained Si, SiGe, and SOI technology for modern semiconductor study.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
24 July 2007
Listed Since
16 February 2007

Barcode

No barcode data available

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