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Springer - Introduction to Focused Ion Beams Textbook

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Description

Expand your scientific knowledge with Introduction to Focused Ion Beams by Springer. This specialized text provides a deep dive into the instrumentation, theory, and practical techniques required to master FIB technology. Unlike other resources, this book focuses on the direct relationship between theory and real-world applications, making it an essential resource for researchers and students. This text is unique in its ability to cover the wide range of techniques used in FIBs and dual platform instruments. By bridging the gap between theoretical concepts and practical use, it serves as a comprehensive guide for anyone working in analytical chemistry or materials science. Whether you are studying the fundamental physics or looking to apply these methods in a laboratory setting, this book offers the specific insights needed to understand modern ion beam technology and its diverse uses.

Key Features

Focused on practical applications to help you connect theoretical concepts with real-world scientific use.

Detailed coverage of instrumentation and theory specifically related to FIB technology.

Comprehensive discussion of the many techniques used in FIBs and dual platform instruments.

Designed for professionals and students needing a deep understanding of analytical chemistry and ion beam methods.

Provides a unique perspective by presenting theory in the direct context of practical applications.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
19 November 2004
Listed Since
12 December 2006

Barcode

No barcode data available

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