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Springer Introduction to Focused Ion Beams - Springer Science Book

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Price range: £126 - £161

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Description

Introduction to Focused Ion Beams is a comprehensive guide bridging theory and practical application for ion beam instrumentation. This text stands apart by directly connecting theoretical principles to real-world FIB applications and dual platform techniques. Covering instrumentation fundamentals, analytical methods, and hands-on practices, it serves as an essential resource for scientists, engineers, and researchers working with focused ion beam technology. Whether you are exploring ion beam microscopy, material analysis, or advanced sample preparation, this book provides both the conceptual foundation and practical insights needed to master FIB systems and their diverse industrial and research applications.

Key Features

Focused Ion Beams instrumentation guide covers theory and practical applications for researchers and professionals.

Comprehensive FIB techniques section explores dual platform instruments and their analytical capabilities.

Introduction to Focused Ion Beams published by Springer for academic and professional reference.

Detailed applications overview demonstrates real-world uses of ion beam technology across multiple fields.

Theory-to-practice approach connects fundamental principles directly to focused ion beam instrumentation methods.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
19 November 2004
Listed Since
12 December 2006

Barcode

No barcode data available

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