We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£158.28
Springer - Introduction to Focused Ion Beams Textbook
Price data last checked 18 day(s) ago - will refresh soon
We'll watch every seller, every day. One email when your price arrives.
About as cheap as it gets. The only time it was cheaper was 2 months ago.
£158 today · all-time low £155 (Mar 2026) · usually £159
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 73 days • 73 data points (No recent data available)
Price Distribution
Price distribution over 73 days • 3 price levels
Price Analysis
Most common price: £160 (43 days, 58.9%)
Price range: £155 - £160
Price levels: 3 different prices over 73 days
Description
Key Features
Focused on practical applications to help you connect theoretical concepts with real-world scientific use.
Detailed coverage of instrumentation and theory specifically related to FIB technology.
Comprehensive discussion of the many techniques used in FIBs and dual platform instruments.
Designed for professionals and students needing a deep understanding of analytical chemistry and ion beam methods.
Provides a unique perspective by presenting theory in the direct context of practical applications.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 0387231161
- Domain
- Amazon UK
- Release Date
- 19 November 2004
- Listed Since
- 12 December 2006
Barcode
No barcode data available
Similar Products You Might Like
Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
Springer
Introduction to Focused Ion Beam Nanometrology (IOP Concise Physics)
Morgan & Claypool
Focused Ion Beam Systems: Basics and Applications
Cambridge University Press
Focused Ion Beam Systems: Basics and Applications
Cambridge University Press
High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
Springer
High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
Springer
Ion Beam Technology and Applications
IntechOpen
Ion Beams in Nanoscience and Technology (Particle Acceleration and Detection)
Springer
Ion Beams in Nanoscience and Technology (Particle Acceleration and Detection)
Springer
The 2025-2030 World Outlook for Focused Ion Beam
Ion Sources
Springer
Ion Beam Analysis: Fundamentals and Applications
CRC Press
Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization (Materials Characterization and Analysis Collection)
Momentum Press
Swift Heavy Ions for Materials Engineering and Nanostructuring: 145 (Springer Series in Materials Science, 145)
Springer
Swift Ion Beam Analysis in Nanosciences (Iste)
Wiley
Screening Constant by Unit Nuclear Charge Method: Description and Application to the Photoionization of Atomic Systems (Waves)
Wiley
Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems
The 2023-2028 World Outlook for Ion Beam Technologies
Handbook of Ion Sources
CRC Press
Development and Applications of Negative Ion Sources: 125 (Springer Series on Atomic, Optical, and Plasma Physics, 125)
Springer
Indium Phosphide and Related Materials: Processing, Technology and Devices (Materials Library S.)
Artech House
Umladung von langsamen, mehrfach geladenen Ionen in Neutralgasen: 3151 (Forschungsberichte des Landes Nordrhein-Westfalen, 3151)
VS Verlag für Sozialwissenschaften
Practical Implementation of Light Ion Beam Treatments
Medical Physics Publishing Corporation