We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£157.34
Springer High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
Price data last checked 45 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
About as cheap as it gets. The only time it was cheaper was 2 months ago.
£157 today · all-time low £156 (May 2026) · usually the usual
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 46 days · 46 data points (no recent data)
Price Distribution
Price distribution over 46 days • 3 price levels
Price Analysis
Most common price: £157 (26 days, 56.5%)
Price range: £156 - £159
Price levels: 3 different prices over 46 days
Description
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 030647350X
- Domain
- Amazon UK
- Release Date
- 31 October 2002
- Listed Since
- 07 February 2007
Barcode
No barcode data available
Similar Products You Might Like
High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
Springer
Focused Ion Beam Systems: Basics and Applications
Cambridge University Press
Focused Ion Beam Systems: Basics and Applications
Cambridge University Press
Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
Springer
Springer - Introduction to Focused Ion Beams Textbook
Springer
FIB Nanostructures: 20 (Lecture Notes in Nanoscale Science and Technology, 20)
Springer
Swift Ion Beam Analysis in Nanosciences (Iste)
Wiley
Ion Beams in Nanoscience and Technology (Particle Acceleration and Detection)
Springer
Ion Beams in Nanoscience and Technology (Particle Acceleration and Detection)
Springer
Introduction to Focused Ion Beam Nanometrology (IOP Concise Physics)
Morgan & Claypool
Wiley Metal Vapour Ion Lasers: Kinetic Processes and Gas Discharges
Wiley
Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems
Differential Ion Mobility Spectrometry: Nonlinear Ion Transport and Fundamentals of FAIMS
CRC Press
Ion Beam Analysis: Fundamentals and Applications
CRC Press
Handbook of Ion Sources
CRC Press
Differential Ion Mobility Spectrometry: Nonlinear Ion Transport and Fundamentals of FAIMS
CRC Press
Ionization and Plasma Dynamics of Single Large Xenon Clusters in Superintense XUV Pulses (Springer Theses)
Springer
Practical Implementation of Light Ion Beam Treatments
Medical Physics Publishing Corporation
Ion Beam Analysis: Fundamentals and Applications
CRC Press
Ion Beam Modification of Solids: Ion-Solid Interaction and Radiation Damage: 61 (Springer Series in Surface Sciences, 61)
Springer
Physics and Applications of High Brightness Electron Beams
World Scientific Publishing Company
Helium Ion Microscopy (NanoScience and Technology)
Springer
Optical Technologies for Extreme-Ultraviolet and Soft X-ray Coherent Sources: 197 (Springer Series in Optical Sciences, 197)
Springer
Swift Heavy Ions for Materials Engineering and Nanostructuring: 145 (Springer Series in Materials Science, 145)
Springer