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Springer Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice

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Description

Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
29 October 2010
Listed Since
06 July 2010

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