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Springer Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
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Description
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 1441935746
- Domain
- Amazon UK
- Release Date
- 29 October 2010
- Listed Since
- 06 July 2010
Barcode
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