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£155.00
It has never been this cheap. We have no record of a lower price.
£155 today · cheaper than every other day in the last 3 months
Metrology, Inspection, and Process Control for Microlithography XXVI
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Price History & Forecast
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Last 89 days · 89 data points
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Price Distribution
Price distribution over 89 days • 1 price levels
Price Analysis
Most common price: £155 (89 days, 100.0%)
Price range: £155 - £155
Price levels: 1 different prices over 89 days
Description
Key Features
SPIE Press publication from the 2012 Metrology, Inspection, and Process Control for Microlithography XXVI conference held in San Jose.
Peer-reviewed technical papers covering advanced metrology techniques and inspection methodologies for semiconductor microlithography applications.
Expert contributions addressing process control strategies and quality assurance protocols essential for microelectronics fabrication.
Comprehensive reference for applied optics professionals, engineers, and researchers working in semiconductor manufacturing and precision measurement.
Product Specifications
- Format
- paperback
- ASIN
- 0819489808
- Domain
- Amazon UK
- Release Date
- 15 June 2012
- Listed Since
- 10 November 2012
Barcode
No barcode data available
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