We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£195.00
Eighth International Symposium on Precision Engineering Measurement and Instrumentation: 8-11 August 2012, Chengdu, China (Proceedings of SPIE)
Price data last checked 35 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£195 today · cheaper than every other day in the last 3 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 56 days · 56 data points (no recent data)
Price Distribution
Price distribution over 56 days • 1 price levels
Price Analysis
Most common price: £195 (56 days, 100.0%)
Price range: £195 - £195
Price levels: 1 different prices over 56 days
Product Specifications
- Format
- paperback
- ASIN
- 0819495506
- Domain
- Amazon UK
- Release Date
- 30 April 2013
- Listed Since
- 12 May 2013
Barcode
No barcode data available
Similar Products You Might Like
Third International Conference on Smart Materials and Nanotechnology in Engineering: 5-8 December 2011, Shenzhen, China (Proceedings of SPIE)
Optical Metrology and Inspection for Industrial Applications II: 5-7 November 2012, Beijing, China (Proceedings of SPIE): No. 8563
SPIE Proceedings: Space Exploration Technologies and Applications
Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications VIII: 25-26 January 2012, San Francisco, California, United States
Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications X: 6-7 February 2013, San Francisco, California, United States (Proceedings of SPIE): No. 8594
Two- and Three-dimensional Methods for Inspection and Metrology V: 5 (Proceedings of SPIE)
International Conference on Optical Instruments and Technology 2008: Optical Systems and Optoelectronic Instruments (Proceedings of Spie)
Imaging Spectrometry XV: 2-3 August 2010, San Diego, California, United States
International Conference on Optical Instruments and Technology 2008: Microelectronic and Optoelectronic Devices and Integration (Proceedings of Spie)
Advanced Sensor Systems and Applications: Volume IV: 18-20 October 2010, Beijing, China
Digital Photography IX: 4-6 February 2013, Burlingame, California, United States (Proceedings of SPIE): No. 8660
Optoelectronic Interconnects XIII: 3-6 February 2013, San Francisco, California, United States (Proceedings of SPIE)
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-electronic Technology, and Artificial Intelligence (Proceedings of SPIE)
International Conference on Display and Photonics 2010: 12-13 July 2010, Nanjing, China (Proceedings of SPIE)
Imaging Spectrometry XVI: 22-23 August 2011, San Diego, California, United States
Emerging Digital Micromirror Device Based Systems and Applications IV: 23-25 January 2012, San Francisco, California, United States
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XX, 5-7 February 2013, San Francisco, California, United States (Proceedings of SPIE): No. 8589
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2008 (Proceedings of SPIE)
Smart Biomedical and Physiological Sensor Technology X (Proceedings of SPIE): No. 8719
MOEMS and Miniaturized Systems XII: 4-6 February 2013, San Francisco, California, United States (Proceedings of SPIE): No. 8616
Single Molecule Spectroscopy and Superresolution Imaging V: 21-22 January 2012, San Francisco, California, United States (Proceedings of SPIE)
Modeling, Signal Processing, and Control (Smart Structures & Materials 2002) (Proceedings of Spie)
Micromachining and Microfabrication Process Technology XVII: 24 and 26 January 2012, San Francisco, California, United States