We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£150.00
Metrology, Inspection, and Process Control for Microlithography XXV: 28 March-3 April 2011, San Jose, California, United States
Price data last checked 53 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£150 today · cheaper than every other day in the last 3 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 38 days • 38 data points (No recent data available)
Price Distribution
Price distribution over 38 days • 1 price levels
Price Analysis
Most common price: £150 (38 days, 100.0%)
Price range: £150 - £150
Price levels: 1 different prices over 38 days
Product Specifications
- Format
- paperback
- ASIN
- 0819485306
- Domain
- Amazon UK
- Release Date
- 15 June 2011
- Listed Since
- 22 June 2012
Barcode
No barcode data available
Similar Products You Might Like
Optical Microlithography: Volume XXIV: 1-3 March 2011, San Jose, California, United States (Proceedings of SPIE)
Optical Metrology and Inspection for Industrial Applications II: 5-7 November 2012, Beijing, China (Proceedings of SPIE): No. 8563
Modeling Aspects in Optical Metrology III: 23-24 May 2011, Munich, Germany
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processings XIX : 24-26 January 2012, San Francisco, California, United States
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XX, 5-7 February 2013, San Francisco, California, United States (Proceedings of SPIE): No. 8589
Advanced Microscopy Techniques II: 22-24 May 2011, Munich, Germany
Imaging Spectrometry XVI: 22-23 August 2011, San Diego, California, United States
Emerging Digital Micromirror Device Based Systems and Applications IV: 23-25 January 2012, San Francisco, California, United States
Industrial Applications of Optical Inspection, Metrology, and Sensing: 19-20 November 1992, Boston, Massachusetts (Proceedings of S P I E)
Optical Microlithography XVII (SPIE Conference Proceedings) (Proceedings of SPIE)
Imaging Spectrometry XV: 2-3 August 2010, San Diego, California, United States
Clinical and Biomedical Spectroscopy and Imaging II: 24-26 May 2011, Munich, Germany
Three-Dimensional and Multidimensional Microscopy: Volume XVIII: Image Acquisition and Processing : 24-27 January 2011, San Francisco, California, ... San Francisco, California, United States)
Endoscopic Microscopy VI: 23-24 January 2011, San Jose, California, United States
Optoelectronic Interconnects and Component Integration XI: 24-26 January 2011, San Francisco, California, United States
Interferometry XV: Techniques and Analysis: 2-4 August 2010, San Diego, California, United States
Next-generation Spectroscopic Technologies V: 23-24 April 2012, Baltimore, Maryland, United States (International Society for Optical English Proceedings of Spie): 8374
Three-dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII (Proceedings of SPIE)
Photonic Therapeutics and Diagnostics VII: 22-24 January 2011, San Francisco, California, United States
Three-Dimensional Imaging, Optical Metrology, and Inspection: V (Proceedings of SPIE): 3835 (Proceedings of Spie--The International Society for Optical Engineering, V. 3835.)
Eighth International Symposium on Precision Engineering Measurement and Instrumentation: 8-11 August 2012, Chengdu, China (Proceedings of SPIE)
Optical Components and Materials: Volume VIII: 25-26 January 2011, San Francisco, California, United States (Optical Components and Materials: 25-26 ... San Francisco, California, United States)
Detectors and Imaging Devices: Infrared, Focal Plane, Single Photon : 4-5 August 2010, San Diego, California, United States