We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£149.44
This is the most expensive it has ever been. Walk away.
£149 today · previous high £149 · all-time low £145
Springer Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices: 220 (NATO Science Series II: Mathematics, Physics and Chemistry, 220)
We'll watch every seller, every day. One email when your price arrives.
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 73 days · 73 data points (no recent data)
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price Distribution
Price distribution over 73 days • 4 price levels
Price Analysis
Most common price: £149 (46 days, 63.0%)
Price range: £145 - £149
Price levels: 4 different prices over 73 days
Description
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 1402043651
- Domain
- Amazon UK
- Release Date
- 27 January 2006
- Listed Since
- 27 December 2006
Barcode
No barcode data available
Similar Products You Might Like
Ultrathin Dielectrics on Si Devices - NATO Science Vol. 47
Springer
High Dielectric Constant Materials: VLSI MOSFET Applications: 16 (Springer Series in Advanced Microelectronics, 16)
Springer
Ultrathin Dielectrics on Si-based Devices - NATO Science Partnership
Springer
Low-Dimensional Structures in Semiconductors: From Basic Physics to Applications: 281 (NATO Science Series B:, 281)
Springer
Defects in Microelectronic Materials and Devices
CRC Press
Science and Engineering of One- and Zero-Dimensional Semiconductors: 214 (NATO Science Series B:, 214)
Springer
Gettering Defects in Semiconductors: 19 (Springer Series in Advanced Microelectronics, 19)
Springer
Nonideal Heterojunctions for Image Sensors (Material Science and Technologies)
Identification of Defects in Semiconductors (Volume 51B) (Semiconductors and Semimetals, Volume 51B)
Elsevier
Heteroepitaxy of Semiconductors: Theory, Growth, and Characterization, Second Edition
CRC Press
Heterostructure Epitaxy and Devices - HEAD’97: 48 (NATO Science Partnership Subseries: 3, 48)
Springer
New Developments in Semiconductor Research
Brand: Nova Science Pub Inc
Elsevier Advances in Infrared Photodetectors Volume 84
Elsevier
Modeling Self-Heating Effects in Nanoscale Devices (IOP Concise Physics)
Morgan & Claypool
World Scientific Nanoelectronics: A Molecular View Book
World Scientific Publishing Company
Quantum Wells, Wires and Dots: Theoretical and Computational Physics of Semiconductor Nanostructures, 4th Edition
Wiley
Point and Extended Defects in Semiconductors: 202 (NATO Science Series B:, 202)
Springer
Dopants and Defects in Semiconductors
CRC Press
Extended Defects in Semiconductors: Electronic Properties, Device Effects And Structures
Cambridge University Press
Defects in Advanced Electronic Materials and Novel Low Dimensional Structures (Woodhead Publishing Series in Electronic and Optical Materials)
Elsevier
Heterostructure Epitaxy and Devices - HEAD’97: 48 (NATO Science Partnership Subseries: 3, 48)
Springer
New Research on Semiconductors - Nova Science Publishers
Price unavailable
Ultrawide Bandgap Semiconductors (Volume 107) (Semiconductors and Semimetals, Volume 107)
Elsevier
