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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII: 7 (Proceedings of SPIE)

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Format: paperback
ASIN: 0819470597
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electrical > Nanotechnology
Domain: Amazon UK
Release Date: 19 February 2008
Listed Since: 10 February 2009

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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII: 7 (Proceedings of SPIE)

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