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Reliability, Packaging, Testing, and Characterization of Mems/moems and Nanodevices IX

Applied Optics

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Format: Paperback
ASIN: 0819479888
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electronics & Communications Engineering > Electronics Engineering > Applied Optics
Domain: Amazon UK
Release Date: 15 May 2010
Listed Since: 06 August 2012

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Reliability, Packaging, Testing, and Characterization of Mems/moems and Nanodevices IX

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