We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£68.95
It has never been this cheap. We have no record of a lower price.
£69 today · cheaper than every other day in the last 3 months
Reliability, Packaging, Testing, and Characterization of Mems/moems and Nanodevices IX
We'll watch every seller, every day. One email when your price arrives.
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 70 days · 70 data points (no recent data)
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price Distribution
Price distribution over 70 days • 1 price levels
Price Analysis
Most common price: £69 (70 days, 100.0%)
Price range: £69 - £69
Price levels: 1 different prices over 70 days
Product Specifications
- Format
- paperback
- ASIN
- 0819479888
- Domain
- Amazon UK
- Release Date
- 15 May 2010
- Listed Since
- 06 August 2012
Barcode
No barcode data available
Similar Products You Might Like
Ultrafast Phenomena in Semiconductors and Nanostructure Materials IX (Proceedings of SPIE)
Synthesis and Photonics of Nanoscale Materials IX
Micro (MEMS) and Nanotechnologies for Space, Defense, and Security II (Proceedings of SPIE)
Organic Photonic Materials and Devices IX (Proceedings of SPIE)
Photonics Packaging, Integration, and Interconnects VII (Proceedings of SPIE)
Videometrics IX (Proceedings of SPIE)
Signal Processing, Sensor Fusion, and Target Recognition IX: 4052 (SPIE Conference Proceedings)
Passive Millimeter-wave Imaging Technology IX (Proceedings of SPIE)
Ultrafast Phenomena in Semiconductors and Nanostructure Materials X (Proceedings of SPIE)
Liquid Crystals IX (Proceedings of SPIE)
Optics in Atmospheric Propagation and Adaptive Systems IX (Proceedings of SPIE)
Instrumentation, Metrology, and Standards for Nanomanufacturing II (Proceedings of SPIE)
Micro (mems) and Nanotechnologies for Space Applications (Proceedings of SPIE)
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII: 7 (Proceedings of SPIE)
Physics and Simulation of Optoelectronic Devices XIX
ICO20: MEMS, MOEMS, and NEMS (Proceedings of SPIE)
