We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£115.00
Reliability, Packaging, Testing, and Characterization of Mems/moems VI (Proceedings of SPIE)
Price data last checked 55 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
This is the most expensive it has ever been. Walk away.
£115 today · previous high £115 · all-time low £84
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 36 days • 36 data points (No recent data available)
Price Distribution
Price distribution over 36 days • 2 price levels
Price Analysis
Most common price: £115 (32 days, 88.9%)
Price range: £84 - £115
Price levels: 2 different prices over 36 days
Product Specifications
- Format
- paperback
- ASIN
- 0819465763
- Category
- Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electrical > Nanotechnology
- Domain
- Amazon UK
- Release Date
- 15 June 2007
- Listed Since
- 23 January 2007
Barcode
No barcode data available
Similar Products You Might Like
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII: 7 (Proceedings of SPIE)
MEMS/MOEMS: Advances in Photonic Communications, Sensing, Metrology, Packaging and Assembly (Proceedings of SPIE)
International Conference on Optical Instruments and Technology 2008: Mems/ Nems Technology and Applications (Proceedings of Spie)
MEMS, MOEMS, and Micromachining (Proceedings of SPIE)
Reliability, Packaging, Testing, and Characterization of Mems/moems and Nanodevices IX
MOEMS and Miniaturized Systems XII: 4-6 February 2013, San Francisco, California, United States (Proceedings of SPIE): No. 8616
MEMS/MOEMS Components and Their Applications V. Special Focus Topics: Transducers at the Micro-Nano Interface: 5 (Proceedings of SPIE)
Microelectromechanical Systems (Mems) - 1999
MOEMS Display, Imaging, and Miniaturized Microsystems IV (Proceedings of SPIE)
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII (Proceedings of SPIE): v. 7206
Bio-Mems and Medical Microdevices (Proceedings of SPIE): No. 8765
ICMIT 2007: Mechatronics, MEMS, and Smart Materials (Proceedings of SPIE)
Imaging, Manipulation, and Analysis of Biomolecules, Cells, and Tissues VI (Proceedings of SPIE)
Mems/moems Components and Their Applications IV (Proceedings of SPIE)
MOEMS and Miniaturized Systems IV (Proceedings of SPIE): Proceedings of Spie, 27-28 January 2004, San Jose, California, USA
