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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII (Proceedings of SPIE): v. 7206

Nanotechnology

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Format: Paperback
ASIN: 0819474525
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electrical > Nanotechnology
Domain: Amazon UK
Release Date: 15 June 2009
Listed Since: 10 February 2009

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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII (Proceedings of SPIE): v. 7206

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