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£174.58
Wiley Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy (Quality and Reliability Engineering)
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Last 73 days • 73 data points (No recent data available)
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Price distribution over 73 days • 5 price levels
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Most common price: £165 (25 days, 34.2%)
Price range: £162 - £175
Price levels: 5 different prices over 73 days
Description
Product Specifications
- Brand
- Wiley
- Format
- hardcover
- ASIN
- 047149240X
- Category
- Books > Subjects > Science, Nature & Maths > Experiments, Instruments & Measurements > Microscopy
- Domain
- Amazon UK
- Release Date
- 10 November 2000
- Listed Since
- 13 February 2007
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