Springer Positron Annihilation in Semiconductors: Defect Studies

Positron Annihilation in Semiconductors: Defect Studies (Springer Series in Solid-State Sciences, 127) provides a comprehensive look at semiconductor defects. This text is designed to serve a wide audience, ranging from specialists in positron annihilation to scientists, technicians, and students interested in the study of defects within semiconductors. To ensure a deep understanding of the subject, the book explains the theoretical basics required to interpret the experimental results presented throughout the work. It bridges the gap between fundamental theory and practical application, making it a valuable resource for those working in analytical chemistry and solid-state science. Whether you are conducting research or studying the properties of semiconductors, this volume offers the foundational knowledge and experimental data necessary for your technical work.