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Springer Positron Annihilation in Semiconductors - Defect Studies
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Description
Key Features
Positron Annihilation in Semiconductors covers both theoretical basics and experimental methods for defect characterisation in semiconductor materials.
Part of Springer's Solid-State Sciences series (volume 127), providing authoritative content from a leading physics and materials science publisher.
Designed for scientists, technicians, and students working in materials testing and semiconductor engineering fields.
Explains the detailed theoretical framework needed to interpret positron annihilation experimental results and defect analysis data.
Addresses defect studies in semiconductors through a comprehensive approach suitable for specialists and non-specialists in positron physics.
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 3642084036
- Domain
- Amazon UK
- Release Date
- 01 December 2010
- Listed Since
- 20 September 2010
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