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£147.13
Springer Positron Annihilation in Semiconductors: Defect Studies
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Description
Key Features
Comprehensive coverage of positron annihilation techniques specifically applied to semiconductor defect studies.
Detailed theoretical explanations that provide the necessary foundation to understand complex experimental results.
Written for a diverse academic audience including specialists, technicians, and students in the field.
Part of the respected Springer Series in Solid-State Sciences, volume 127.
Focuses on the practical connection between theoretical basics and real-world experimental data.
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 3642084036
- Domain
- Amazon UK
- Release Date
- 01 December 2010
- Listed Since
- 20 September 2010
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